Multi channel detector, optics therefor and method of operating thereof
AssigneeICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
InventorPavel Adamec
Life of this patent
Estimating the term…
Loading patent…
AssigneeICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
InventorPavel Adamec
Estimating the term…
A secondary charged particle detection device for detection of a signal beam is described. The device includes a detector arrangement having at least two detection elements with active detection areas, wherein the active detection areas are separated by a gap, a particle optics configured for separating the signal beam in a first portion of the signal beam and in at least one second portion of the signal beam, configured for focusing the first portion of the signal beam, and configured for deflecting and focusing the at least one second portion of the signal beam, wherein the particle optics includes a first electrode and at least one second electrode. Therein, the first electrode is an inner electrode and the at least one second electrode is provided radially outward of the first electrode.
A secondary charged particle detection device for detection of a signal beam, comprising:
A charged particle beam device, comprising:
A charged particle multi-beam device comprising:
A method of operating a detection device, the method comprising:
Dependencies are inferred from the claim text.