Backscatter reduction in thin electron detectors
AssigneeFEI Company
InventorsGerrit Cornelis Van Hoften, Michael Alwin William Stekelenburg, Richard Henderson, Gregory James McMullan, Abdul Raffey Faruqi, Renato Andrea Danilo Turchetta, Nicola Carlo Guerrini, Joeri Lof, Frank Jeroen Pieter Schuurmans
Life of this patent
Estimating the term…