Magnifying observation apparatus

A magnifying observation apparatus comprising:

• a body portion has a substantially cylindrical shaped outer surface and an internal space of the body portion being able to decompress as a specimen chamber;
• a pair of end-face plates that closes end faces of the body portion, the end faces being disposed opposite to each other;
• an electron beam imaging device as a first observation device, the electron beam imaging device being mounted on a first position of the cylindrical shaped outer surface of the body portion to obtain an electron microscope image in the specimen chamber and having a first optical axis;
• an optical imaging device as a second observation device, the optical imaging device being mounted on a second position in the cylindrical shaped outer surface of the body portion to obtain an optical image in the specimen chamber, the second position being different from the first position and having a second optical axis having an intersection with the first optical axis of the electron beam imaging device within the specimen chamber;
• a rotating device configured to rotate the body portion, and the electron beam imaging device and the optical imaging device along the cylindrical shaped outer surface of the body portion and around the intersection of both of the first optical axis and the second optical axis as a rotation axis such that a distance from each of the electron beam imaging device and the optical imaging device to the rotation axis of the electron beam imaging device and the optical imaging device is kept constant, wherein the rotating device is configured a) to rotate the electron imaging device to a position that provides a same visual field as the optical imaging device or b) to rotate the optical imaging device to a position that provides a same visual field as the electron imaging device;
• a specimen stage that is disposed in the specimen chamber to place a specimen of an observation target;
• and
• a specimen stage adjusting section that adjusts a height of an observation surface for the specimen placed on the specimen stage to a position that is at substantially the same height as a height of the rotation axis.