High temperature tungsten metallization process
AssigneeApplied Materials, Inc.
InventorsJoshua Collins, Murali K. Narasimhan, Jingjing Liu, Sang-Hyeob Lee, Kai Wu, Avgerinos V. Gelatos
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AssigneeApplied Materials, Inc.
InventorsJoshua Collins, Murali K. Narasimhan, Jingjing Liu, Sang-Hyeob Lee, Kai Wu, Avgerinos V. Gelatos
Estimating the term…
Embodiments of the invention provide an improved process for depositing tungsten-containing materials. In one embodiment, the method for forming a tungsten-containing material on a substrate includes forming an adhesion layer containing titanium nitride on a dielectric layer disposed on a substrate, forming a tungsten nitride intermediate layer on the adhesion layer, wherein the tungsten nitride intermediate layer contains tungsten nitride and carbon. The method further includes forming a tungsten barrier layer (e.g., tungsten or tungsten-carbon material) from the tungsten nitride intermediate layer by thermal decomposition during a thermal annealing process (e.g., temperature from about 700° C. to less than 1,000° C.). Subsequently, the method includes optionally forming a nucleation layer on the tungsten barrier layer, optionally exposing the tungsten barrier layer and/or the nucleation layer to a reducing agent during soak processes, and forming a tungsten bulk layer on or over the tungsten barrier layer and/or the nucleation layer.
A method for forming a tungsten-containing material on a substrate, comprising:
A method for forming a tungsten-containing material on a substrate, comprising:
A method for forming a tungsten-containing material on a substrate, comprising:
Dependencies are inferred from the claim text.