Cleaning composition, method for producing semiconductor device, and cleaning method
AssigneeFUJIFILM Corporation
InventorsTadashi Inaba, Kazutaka Takahashi, Tomonori Takahashi, Atsushi Mizutani
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AssigneeFUJIFILM Corporation
InventorsTadashi Inaba, Kazutaka Takahashi, Tomonori Takahashi, Atsushi Mizutani
Estimating the term…
Provided are a cleaning composition which is capable of inhibiting the metal of a semiconductor substrate from corrosion, and has an excellent removability of plasma etching residues and/or ashing residues on the semiconductor substrate, a method for producing a semiconductor device, and a cleaning method using the cleaning composition. The cleaning composition for removing plasma etching residues and/or ashing residues formed on a semiconductor substrate, and a preparation method and a cleaning method for a semiconductor device, using the cleaning composition, wherein the cleaning composition includes (Component a) water; (Component b) an amine compound; (Component c) hydroxylamine and/or a salt thereof; (Component d) a quaternary ammonium compound; (Component e) an organic acid; and (Component f) a water-soluble organic solvent; and has a pH of 6 to 9.
A cleaning composition for removing plasma etching residues and/or ashing residues formed on a semiconductor substrate, which includes:
A method for producing a semiconductor device, including:
A cleaning method including:
Dependencies are inferred from the claim text.