Method and system for evaluating contact elements

A system for evaluating contact elements, the system comprises:

• a storage unit adapted to store images of multiple groups of contact elements, wherein each group of contact element was expected to be contacted, during a test, by the same group of probes so as to form multiple probe marks;
• and a processor that is adapted to evaluate at least one characteristic of a first contact element in response to a comparison between a number of potential probe marks that appear in the image of the first contact element and a number of potential probe marks that appear in an image of a second contact element;
• and to deduct that the image of the first contact element comprises an artifact if the number of potential probe marks that appear in the image of the first contact element exceeds the number of potential probe marks that appear in the image of the second contact element, and the expected number of probe marks within the image of the first contact element equals the expected number of probe marks within the image of the second contact element.

A method for evaluating contact elements, the method comprises:

• acquiring images of at least three groups of contact elements of an electrical circuit, wherein each group of contact elements was expected to be contacted during a test by the same group of probes so as to form multiple probe marks;
• and evaluating at least one characteristic of a contact element out of the at least three groups of contact elements in response to a comparison between at least one characteristic of each contact element out of a set of contact elements;
• wherein the set comprises at least at three contact elements out of the at least three groups of contact elements.

A system for evaluating contact elements, the system comprises:

• a storage unit adapted to store images of at least three groups of contact elements of an electrical circuit, wherein each group of contact elements was expected to be contacted during a test by the same group of probes so as to form multiple probe marks;
• and a processor, adapted to evaluate at least one characteristic of a contact element out of the at least three groups of contact elements in response to a comparison between at least one characteristic of each contact element out of a set of contact elements;
• wherein the set comprises at least at three contact elements out of the at least three groups of contact elements.

A computer program product comprising a non-transitory computer usable medium including a computer readable program, wherein the computer readable program when executed on a computer causes the computer to:

• receive images of at least three groups of contact elements of an electrical circuit, wherein each group of contact elements was expected to be contacted during a test by the same group of probes so as to form multiple probe marks;
• and evaluate at least one characteristic of a contact element out of the at least three groups of contact elements in response to a comparison between at least one characteristic of each contact element out of a set of contact elements;
• wherein the set comprises at least at three contact elements out of the at least three groups of contact elements.