X-ray detector for phase contrast imaging
AssigneeKoninklijke Philips N.V.
InventorsChristian Baeumer, Klaus Juergen Engel, Christoph Herrmann
Life of this patent
Estimating the term…
Abstract
The invention relates to an X-ray detector (30) that comprises an array of sensitive elements (Pi−1,b, Pia, Pib, Pi+1,a, Pi+1,b) and at least two analyzer gratings (G2a, G2b) disposed with different phase and/or periodicity in front of two different sensitive elements. Preferably, the sensitive elements are organized in macro-pixels (IIi) of e.g. four adjacent sensitive elements, where analyzer gratings with mutually different phases are disposed in front said sensitive elements. The detector (30) can particularly be applied in an X-ray device (100) for generating phase contrast images because it allows to sample an intensity pattern (I) generated by such a device simultaneously at different positions.
Claims22
An X-ray detector, comprising:
- an array of X-ray sensitive elements;
- at least two analyzer gratings disposed with different phase and/or periodicity in front of two different sensitive elements of the array of X-ray sensitive elements, and
- at least one macro-pixel consisting of a plurality of sensitive elements with analyzer gratings in front of the plurality of sensitive elements, wherein the analyzer gratings have mutually different phase and/or periodicity.
An X-ray device for generating phase contrast images of an object, comprising:
- an X-ray source;
- a diffractive optical element that is exposed to the X-ray source;
- an X-ray detector with an array of X-ray sensitive elements and at least two analyzer gratings disposed with different phase and/or periodicity in front of two different sensitive elements, and;
- a phase grating, wherein the diffractive optical element is a source grating located adjacent the x-ray source and on a first side of an object being scanned and the phase grating is located on an opposing side of the object between the object and the at least two analyzer gratings.
A method for analyzing an X-ray intensity pattern, comprising a simultaneous local sampling of an intensity pattern with analyzer gratings, wherein the analyzer gratings include at least two analyzer gratings disposed with mutually different phase and/or periodicity in front of at least one macro-pixel, consisting of a plurality of sensitive elements.
An X-ray detector, comprising:
- an array of X-ray sensitive elements;
- an
- at least two analyzer gratings disposed with different phase and/or periodicity in front of two different sensitive elements of the array of X-ray sensitive elements,
- wherein a first of the at least two analyzer gratings has absorbing strips that are disposed in front of a first of the two different sensitive elements and not a second of the two different sensitive elements.
An X-ray detector, comprising:
- an array of X-ray sensitive elements;
- and
- at least two analyzer gratings disposed with different phase and/or periodicity in front of two different sensitive elements of the array of X-ray sensitive elements,
- wherein the X-ray detector includes at least four analyzer gratings, each in front of a different sensitive elements of the array of X-ray sensitive elements.
An X-ray device for generating phase contrast images of an object, comprising:
- an X-ray source;
- a diffractive optical element that is exposed to the X-ray source;
- and
- an X-ray detector with an array of X-ray sensitive elements and at least two analyzer gratings disposed with different phase and/or periodicity in front of two different sensitive elements,
- wherein a first of the at least two analyzer gratings has absorbing strips that are disposed in front of a first of the two different sensitive elements and not a second of the two different sensitive elements.
An X-ray device for generating phase contrast images of an object, comprising:
- an X-ray source;
- a diffractive optical element that is exposed to the X-ray source;
- and
- an X-ray detector with an array of X-ray sensitive elements and at least two analyzer gratings disposed with different phase and/or periodicity in front of two different sensitive elements,
- wherein the X-ray detector includes at least four analyzer gratings, each in front of a different sensitive elements of the array of X-ray sensitive elements.
Dependencies are inferred from the claim text.