Method and apparatus for determining a height of a number of spatial positions on a sample
AssigneeMitutoyo Corporation
InventorsMaarten Jozef Jansen, Frans de Nooij
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AssigneeMitutoyo Corporation
InventorsMaarten Jozef Jansen, Frans de Nooij
Estimating the term…
The invention relates to a method and an apparatus for determining a height of a number of spatial positions on a sample, defining a height map of a surface of said sample. The method can involve irradiating the surface of the sample with light including a spatial periodic pattern in a direction perpendicular to an optical axis and moving parallel to the pattern, scanning the surface in the direction of the optical axis for each position of the surface and detecting the light reflected by the sample by a detector during the scanning. In any scanning position, only a single image is taken, and the scanning speed has a predetermined relation to the phase of the periodic pattern. Analyzing an output signal of the detector can involve, for each spatial position of the detector, determining of an amplitude of the signal detected during the scanning and determining a scanning location where the amplitude is maximal.
A method for determining a height of a number of spatial positions on a sample, defining a height map of a surface of said sample, the method comprising:
An apparatus for determining a height of a number of spatial positions on a sample, defining a height map of a surface, the apparatus comprising:
Dependencies are inferred from the claim text.