Calibration method and circuit
AssigneeSTMicroelectronics International N.V.
InventorsChandrajit Debnath, Pratap Narayan Singh
Life of this patent
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Abstract
An analog input signal is sampled, and the sampled analog input signal is converted to a digital value. A calibration value is also sampled, and a single bit of an N bit offset value is calculated from the sampled calibration value. The sampling operations are alternatively performed so that one bit of the offset value is generated for each generated digital value. For example, the process is repeated N times to calculate all N bits of the offset value while generating N digital values.
Claims21
A method, comprising:
- (a) sampling an analog input signal;
- (b) converting the sampled analog input signal to a digital value;
- (c) sampling a calibration value;
- (d) calculating from the sampled calibration value a single bit of an N bit offset value;
- (e) repeating steps (a)-(d) N times so as to calculate all N bits of the offset value.
A method, comprising:
- (a) sampling an analog input signal;
- (b) converting the sampled analog input signal to a digital value;
- (c) sampling a calibration value;
- (d) calculating from the sampled calibration value at least one bit, but less than N bits, of an N bit offset value;
- (e) repeating steps (a)-(d) a number of times so as to calculate all N bits of the offset value.
A converter, comprising:
- a sample/hold circuit having a first input configured to receive an analog input signal and a second input configured to receive a calibration signal;
- a comparator configured to compare a sample of the analog input signal from the sample/hold circuit to a reference;
- a successive approximation register configured to receive an output of the comparator and generate a digital value;
- and
- a calibration circuit configured to process a sample of the calibration signal from the sample/hold circuit to generate an offset value applied by the successive approximation register in generating the digital value;
- wherein a single bit of an N bit offset value is determined for each sample of the analog input signal by the sample/hold circuit and comparison by the comparator.
A converter, comprising:
- a sample/hold circuit having a first input configured to receive an analog input signal and a second input configured to receive a calibration signal;
- a comparator configured to compare a sample of the analog input signal from the sample/hold circuit to a reference;
- a successive approximation register configured to receive an output of the comparator and generate a digital value;
- and
- a calibration circuit configured to process a sample of the calibration signal from the sample/hold circuit to generate an offset value applied by the successive approximation register in generating the digital value;
- wherein at least one bit, but less than N bits, of an N bit offset value is determined for each sample of the analog input signal by the sample/hold circuit and comparison by the comparator.
A method, comprising:
- alternatively:
- sampling an analog input signal;
- and
- sampling a calibration signal;
- processing the analog input signal samples to generate digital output signals;
- processing calibration signal samples to generate an N bit offset value;
- and
- applying the N bit offset value when generating the digital output signals;
- wherein a single bit of the N bit offset value is determined for each alternative sampling operation.
Dependencies are inferred from the claim text.