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US 8,575,978 B2Granted
Semiconductor device, electronic device, and method of testing the semiconductor device
AssigneeRenesas Electronics Corporation
InventorsDanichi Komatsu, Wataru Tanaka, Satoru Ikeda, Yayoi Nagao
Life of this patent
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Abstract
A coupling failure of a supply terminal or a ground terminal is easily detected. A diode is disposed between a supply terminal of a semiconductor device and a first I/O terminal so that the supply terminal is located on a cathode side, and the first I/O terminal is located on an anode side. A determination unit determines whether or not a voltage of the supply terminal is lower than a voltage of the first I/O terminal when a signal of high level equal to a supply voltage is input to the first I/O terminal.
Claims8
A semiconductor device, comprising:
- a supply terminal that receives a supply voltage from an outside and supplies the supply voltage to a power supply line;
- a ground terminal that receives a ground voltage from the outside;
- a first I/O terminal that conducts a logical input signal from the outside;
- a first diode that is disposed between the supply terminal and the first I/O terminal so that the supply terminal is located on a cathode side and the first I/O terminal is located on an anode side;
- and
- a determination unit that compares voltages of the power supply line and the first I/O terminal, and outputs an instruction signal indicating a voltage level of the supply terminal lowering when the voltage of the power supply line is lower than the voltage of the first I/O terminal in receiving a logical high signal.
3 more elements
A semiconductor device, comprising:
- a supply terminal that receives a supply voltage from an outside;
- a ground terminal that receives a ground voltage from the outside;
- a first I/O terminal that conducts at least one of input and output of a signal with respect to the outside;
- a first diode that is disposed between the supply terminal and the first I/O terminal so that the supply terminal is located on a cathode side and the first I/O terminal is located on an anode side;
- and
- a determination unit that determines whether or not a voltage of the supply terminal is lower than a voltage of the first I/O terminal when a signal of high level equal to the supply voltage is input to the first I/O terminal,
- wherein the determination unit includes:
- a first voltage divider that divides a voltage applied between the supply terminal and the ground terminal, and outputs a first divided voltage obtained by voltage division;
- a second voltage divider that divides a voltage applied between the first I/O terminal and the ground terminal, and outputs a second divided voltage obtained by voltage division;
- and
- a first comparator that is driven by the voltage applied between the supply terminal and the ground terminal, and compares the first divided voltage with the second divided voltage, and
- wherein a division ratio of the first and second voltage dividers is set so that the first divided voltage is higher than the second divided voltage when the supply voltage is applied to both of the supply terminal and the first I/O terminal, and the first divided voltage is lower than the second divided voltage when the supply terminal is opened, and the supply voltage is applied to the first I/O terminal.
9 more elements
A semiconductor device, comprising:
- a supply terminal that receives a supply voltage from an outside;
- a ground terminal that receives a ground voltage from the outside;
- a first I/O terminal that conducts at least one of input and output of a signal with respect to the outside;
- a first diode that is disposed between the supply terminal and the first I/O terminal so that the supply terminal is located on a cathode side and the first I/O terminal is located on an anode side;
- and
- a determination unit that determines whether or not a voltage of the supply terminal is lower than a voltage of the first I/O terminal when a signal of high level equal to the supply voltage is input to the first I/O terminal,
- wherein the determination unit includes:
- a first voltage divider that divides a voltage applied between the supply terminal and the ground terminal, and outputs a first divided voltage obtained by voltage division;
- a second voltage divider that divides a voltage applied between the first I/O terminal and the ground terminal, and outputs a second divided voltage obtained by voltage division;
- a first comparator that is driven by the voltage applied between the supply terminal and the ground terminal, and compares the first divided voltage with the second divided voltage;
- a third voltage divider that divides the voltage applied between the supply terminal and the ground terminal, and outputs a third divided voltage obtained by voltage division;
- a fourth voltage divider that divides a voltage applied between the supply terminal and the second I/O terminal, and outputs a fourth divided voltage obtained by voltage division;
- and
- a second comparator that is driven by the voltage applied between the supply terminal and the ground terminal, and compares the third divided voltage with the fourth divided voltage,
- wherein a division ratio of the first and second voltage dividers is set so that the first divided voltage is higher than the second divided voltage when the supply voltage is applied to both of the supply terminal and the first I/O terminal, and the first divided voltage is lower than the second divided voltage when the supply terminal is opened, and the supply voltage is applied to the first I/O terminal, and
- wherein a division ratio of the third and fourth voltage dividers is set so that the third divided voltage is higher than the fourth divided voltage when the ground voltage is applied to both of the ground terminal and the second I/O terminal, and the third divided voltage is lower than the fourth divided voltage when the ground terminal is opened, and the ground voltage is applied to the second I/O terminal.
13 more elements
Dependencies are inferred from the claim text.