GaN-crystal free-standing substrate and method for producing the same
AssigneeSumitomo Electric Industries, Ltd.
InventorsShinsuke Fujiwara, Koji Uematsu, Hitoshi Kasai, Takuji Okahisa
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AssigneeSumitomo Electric Industries, Ltd.
InventorsShinsuke Fujiwara, Koji Uematsu, Hitoshi Kasai, Takuji Okahisa
Estimating the term…
The invention relates to a GaN-crystal free-standing substrate obtained from a GaN crystal grown by HVPE with a (0001) plane serving as a crystal growth plane and at least one plane of a {10-11} plane and a {11-22} plane serving as a crystal growth plane that constitutes a facet crystal region, except for the side surface of the crystal, wherein the (0001)-plane-growth crystal region has a carbon concentration of 5×1016 atoms/cm3 or less, a silicon concentration of 5×1017 atoms/cm3 or more and 2×1018 atoms/cm3 or less, and an oxygen concentration of 1×1017 atoms/cm3 or less; and the facet crystal region has a carbon concentration of 3×1016 atoms/cm3 or less, a silicon concentration of 5×1017 atoms/cm3 or less, and an oxygen concentration of 5×1017 atoms/cm3 or more and 5×1018 atoms/cm3 or less.
A GaN-crystal free-standing substrate comprising
A method for producing a GaN-crystal free-standing substrate, comprising
Dependencies are inferred from the claim text.