Apparatus for measuring objects
AssigneeStotz Feinmesstechnik GmbH
InventorMilan Stamenkovic
Life of this patent
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Abstract
An apparatus for measuring objects includes a base plate for supporting an object to be measured and includes a probe. The probe is movable relative to the object by means of an actuator to sample the object in a contacting manner, wherein the probe carries, and in particular supports in a mount, a sampling body, in particular an elongate sampling body, whose front end is designed as a measuring tip for a contact with the object. The probe is arranged beneath the base plate, wherein at least one recess is provided in the base plate for leading through at least one section of the sampling body.
Claims14
An apparatus for measuring objects, the apparatus comprising:
- a base plate for supporting an object to be measured, the base plate having a planar support surface;
- and
- a probe which is movable relative to the object by means of an actuator to sample the object in a contacting manner,
- wherein the probe carries a sampling body whose front end is formed as a measuring tip for a contact with the object,
- wherein the probe is arranged beneath the base plate, with at least one cut-out being provided in the base plate for leading through at least one section of the sampling body.
An apparatus for measuring objects comprising:
- a base plate for supporting an object to be measured, wherein the base plate has a support surface for the direct placing on of the object to be measured;
- a probe which is movable relative to the object by means of an actuator to sample the object in a contacting manner,
- wherein the probe is arranged beneath the base plate, with at least one cut-out being provided in the base plate for leading through at least one section of the sampling body;
- and
- a holding-down device which is designed to press an object toward the support surface from above for fixing the object to be measured on the base plate.
Dependencies are inferred from the claim text.