# US 8,572,448 B1 · Apparatus and method for testing and debugging an integrated circuit

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- Number: US 8,572,448 B1
- Document ID: US8572448B1
- Status: Granted
- Kind: B1
- Application number: 13/741,496
- Filed: 2013-01-15
- Granted: 2013-10-29
- Earliest claimed: 2003-02-27
- Assignees: Marvell International Ltd.
- Applicants: Marvell International Ltd.
- Inventors: Saeed Azimi; Son Hong Ho; Daniel Smathers
- Web page: https://patentgrep.com/patent/US8572448B1

## CPC

- G01R 31/3177: Testing of logic operation, e.g. by logic analysers
- G01R 31/31705: {Debugging aspects, e.g. using test circuits for debugging, using dedicated debugging test circuits (generation of test sequences therefor G01R31/31835, using scan test therefor G01R31/318544)}
- G01R 31/318572: {Input/Output interfaces}
- G06F 11/2236: {to test CPU or processors}
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)

## Abstract

A system including a frame capture module, a serializer, and a deserializer. The frame capture module is configured to receive, from a device under test, data corresponding to test results, and package the data into first data frames. The serializer is configured serialize the first data frames to form serial messages that include serialized data. The serializer includes i) a first serial link configured to output the serial messages according to a first clock domain, and ii) a second serial link configured to output the serial messages according to a second clock domain. The deserializer is configured to deserialize the serial messages received on the first serial link and the second serial link to form second data frames.

## Claims

### Claim 1

A system, comprising:
a system on a chip (SOC) including a device under test, the SOC configured to i) package data into first data frames, wherein the data corresponds to test results associated with the device under test, and ii) serialize the first data frames to form messages in a serial data format;
a deserializing module configured to i) deserialize the messages to form second data frames, and ii) output control code corresponding to the messages, wherein the control code includes status information associated with the messages; and
a diagnostic module configured to i) receive the control code from the deserializing module, and ii) generate, based on the control code, diagnostic data associated with states of the device under test.

### Claim 2 (depends on 1)

The system of claim 1, wherein the control code is in a digital format, and wherein the diagnostic module is configured to provide the control code in the digital format to a logic analyzer.

### Claim 3 (depends on 2)

The system of claim 2, wherein the diagnostic module is configured to convert the control code from the digital format to an analog format.

### Claim 4 (depends on 3)

The system of claim 3, wherein the diagnostic module is configured to provide the control code in the analog format to an oscilloscope.

### Claim 5 (depends on 1)

The system of claim 1, wherein the status information includes error messages.

### Claim 6 (depends on 1)

The system of claim 1, wherein the SOC includes a diagnostic control module configured to generate the control code.

### Claim 7 (depends on 6)

The system of claim 6, wherein the SOC is configured to package the control code with the data in the first data frames.

### Claim 8 (depends on 6)

The system of claim 6, wherein the diagnostic control module is configured to select between i) providing a first number of data words of the control code, and ii) providing a second number of data words of the control code.

### Claim 9

A method, comprising:
packaging data into first data frames, wherein the data corresponds to test results associated with a device under test;
serializing the first data frames to form messages in a serial data format;
deserializing the messages to form second data frames;
outputting control code corresponding to the messages, wherein the control code includes status information associated with the messages; and
generating, based on the control code, diagnostic data associated with states of the device under test.

### Claim 10 (depends on 9)

The method of claim 9, wherein the control code is in a digital format, and further comprising providing the control code in the digital format to a logic analyzer.

### Claim 11 (depends on 10)

The method of claim 10, further comprising converting the control code from the digital format to an analog format.

### Claim 12 (depends on 11)

The method of claim 11, further comprising providing the control code in the analog format to an oscilloscope.

### Claim 13 (depends on 9)

The method of claim 9, wherein the status information includes error messages.

### Claim 14 (depends on 9)

The method of claim 9, further comprising generating the control code on a system on a chip (SOC) that includes the device under test.

### Claim 15 (depends on 14)

The method of claim 14, further comprising packaging the control code with the data in the first data frames.

### Claim 16 (depends on 14)

The method of claim 14, further comprising selecting between i) providing a first number of data words of the control code, and ii) providing a second number of data words of the control code.