Computing device and method for managing motherboard test

A computing device, the computing device comprising:

• at least one processor;
• a storage system;
• and
• one or more modules that are stored in the storage system and executed by the at least one processor, the one or more modules comprising:
• a first creation module operable to create a first test data consisting of test items for a particular type of a motherboard according to a serial number of the motherboard, and write the first test data into a test script, the first test data comprising test bits and a checksum, each of the test bits representing a test item of the motherboard;
• an analysis module operable to read the first test data from the test script, and identify selected test items to perform according to the test bits corresponding to the selected test items;
• a second creation module operable to obtain a second test data by performing a logical NOR operation on the test bits corresponding to the selected test items in the first control data;
• a test control module operable to test the motherboard by performing the selected test items in the second test data, and determining whether each of the selected test items passes a test of the motherboard;
• a third creation module operable to create a third test data by setting the test bits corresponding to the selected test items that pass the test in the second test data to the test bits of the selected test items in the first test data, and by setting the test bits corresponding to the selected test items that fail the test in the second test data to the test bits of the test items that have not been selected in the first test data;
• a result generation module operable to determine a test result of the motherboard by comparing the third test data with the first test data;
• and
• a report module operable to report the test result of the motherboard to display on a display device that is electronically connected to the computing device.

A non-transitory storage medium having stored thereon instructions that, when executed by a processor of a computing device, causes the processor to perform a method for managing a test procedure of a motherboard, the method comprising:

• creating a first test data consisting of test items for a particular type of a motherboard according to a serial number of the motherboard, and writing the first test data into a test script, the first test data comprising test bits and a checksum, each of the test bits representing a test item of the motherboard;
• reading the first test data from the test script, and identifying selected test items to perform according to the test bits corresponding to the selected test items;
• obtaining a second test data by performing a logical NOR operation on the test bits corresponding to the selected test items in the first test data;
• testing the motherboard by performing the selected test items in the second test data, and determining whether each of the selected test items passes a test of the motherboard;
• creating a third test data by setting the test bits corresponding to the selected test items that pass the test in the second test data to the test bits of the selected test items in the first test data, and by setting the test bits corresponding to the selected test items that fail the test in the second test data to the test bits of the test items that have not been selected in the first test data;
• determining a test result of the motherboard by comparing the third test data with the first test data;
• and
• reporting the test result of the motherboard to display on a display device that is electronically connected to the computing device.