Photon induced near field electron microscope and biological imaging system
AssigneeCalifornia Institute of Technology
InventorsAhmed H. Zewail, David J. Flannigan, Brett Barwick
Life of this patent
Estimating the term…
Abstract
A method of obtaining PINEM images includes providing femtosecond optical pulse, generating electron pulses, and directing the electron pulses towards a sample. The method also includes overlapping the femtosecond optical pulses and the electron pulses spatially and temporally at the sample and transferring energy from the femtosecond optical pulses to the electron pulses. The method further includes detecting electron pulses having an energy greater than a zero loss value, providing imaging in space and time.
Claims20
A method of imaging a sample, the method comprising:
- providing a first set of optical pulses and a second set of optical pulses;
- directing the first set of optical pulses to impinge on a cathode;
- generating a set of electron pulses in response to the first set of pulses, wherein the set of electron pulses are characterized by a first energy;
- directing the set of electron pulses to impinge on a sample;
- directing the second set of optical pulses to impinge on the sample;
- transmitting the set of electron pulses through the sample, the set of electron pulses transmitted through the sample being representative of an image of the sample;
- detecting the set of electron pulses transmitted through the sample to provide a data signal as a function of electron energy and associated with the image of the sample, wherein an energy of the set of electron pulses transmitted through the sample is different than the first energy;
- and
- transmitting the data signal to an output device.
A method of obtaining electron microscopy images, the method comprising:
- providing optical pulses;
- generating electron pulses;
- directing the electron pulses towards a sample;
- overlapping the optical pulses and the electron pulses in a vicinity of the sample;
- transferring energy between the optical pulses and the electron pulses;
- and
- detecting the electron pulses as a function of electron energy and having an energy greater than a zero loss value.
A method of imaging a sample, the method comprising:
- providing an optical pulse characterized by a predetermined polarization;
- providing an electron pulse;
- overlapping the optical pulse and the electron pulse temporally in a vicinity of a sample, wherein the sample has a spatial feature defined by a primary axis;
- detecting the electron pulse after propagation past the vicinity of the sample;
- a) determining an electron energy of the electron pulse to provide a data signal;
- b) modifying the predetermined polarization with respect to the primary axis;
- and
- c) repeating a) and b) until the predetermined polarization is substantially perpendicular to the primary axis.
Dependencies are inferred from the claim text.