Phase noise tolerant sampling
AssigneeDust Networks, Inc.
InventorsMark Alan Lemkin, Thor Nelson Juneau
Life of this patent
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AssigneeDust Networks, Inc.
InventorsMark Alan Lemkin, Thor Nelson Juneau
Estimating the term…
Phase noise in a first clock signal is measured using a time to digital converter (TDC) by determining variations in the phase delay between the first clock signal and a second clock signal. The TDC can include first and second series interconnections of delay elements, first and second sets of latches, and processing circuitry coupled to the latches and configured to determine the phase delay. The TDC can include a series interconnection of delay elements, latches, and circuitry configured to selectively adjust the control signal connected to the delay elements based on the output of the latches. The phase noise measurement can be used in a sampling circuit, so as to produce a second data signal from a first data signal based on the first clock signal and the measured phase noise.
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Dependencies are inferred from the claim text.