Testing of analog-to-digital converters
AssigneeSTMicroelectronics Asia Pacific Pte Ltd
InventorsChee Weng Cheong, Kien Beng Tan
Life of this patent
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Abstract
Complete testing of an analog-to-digital converter (ADC) can be carried out using digital signals and at high speeds. Circuit elements are added to an ADC so that a first phase of testing may be carried out using a limited number of analog test voltages. The ADC may then be reconfigured using added circuit elements to disable conventional analog-to-digital conversion. A digital signal may then be applied to the ADC to rapidly test all switching elements used in analog-to-digital conversion. According to some implementations, testing times for ADCs may be reduced from hours to milliseconds.
Claims17
A method of testing an analog-to-digital converter (ADC) that includes a resistive network for converting analog signals, the method comprising:
- isolating one end of the resistive network from any reference potential while recording a test measurement;
- and
- digitally testing internal conversion circuit elements of the ADC with an externally applied digital signal.
An analog-to-digital converter (ADC) comprising:
- a plurality of switches for use in converting an analog input voltage to a digital output code corresponding to the analog input voltage;
- a resistive network coupled to the plurality of switches;
- an isolation switch configured to isolate one end of the resistive network from any reference potential;
- and
- a digital test input configured to receive a signal for activating the plurality of switches.
Dependencies are inferred from the claim text.