Test apparatus, additional circuit and test board for judgment based on peak current
AssigneeAdvantest Corporation
InventorYoshihiro Hashimoto
Life of this patent
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Abstract
Provided is a test apparatus that measures a peak in a current supplied to a device under test via a transmission path which transmits power from a power supply to a device under test, the peak including a frequency component higher than a frequency corresponding to a product of an inductance component from the power supply to the device under test and a capacitance component between the transmission path and a ground potential, and judges acceptability of the device under test based on the peak measured by the current measuring section.
Claims20
A test apparatus that tests a device under test, comprising:
- a power supply that generates power supplied to the device under test;
- a transmission path that transmits the power generated by the power supply to the device under test;
- a current measuring section that measures a peak in current supplied to the device under test via the transmission path, the peak including a frequency component higher than a frequency corresponding to a product of an inductance component from the power supply to the device under test and a capacitance component between the transmission path and a ground potential;
- and
- a judging section that judges acceptability of the device under test based on the peak.
An additional circuit that is used in a test apparatus for testing a device under test, the test apparatus including a power supply that generates power supplied to the device under test, a transmission path that transmits the power generated by the power supply to the device under test;
- test and a judging section that judges acceptability of the device under test based on a peak in current supplied to the device under test, the additional circuit comprising:
- a peak measuring section operable to
- measure the peak in the current supplied to the device under test via the transmission path, the peak including a frequency component higher than a frequency corresponding to a product of an inductance component from the power supply to the device under test and a capacitance component between the transmission path and a ground potential, and
- notify the judging section concerning the measured peak.
A test board that is used in a test apparatus for testing a device under test, comprising:
- a transmission path that transmits power generated by a power supply, which is provided in a test apparatus, to the device under test;
- and
- a peak measuring section operable to
- measure a peak in current supplied to the device under test via the transmission path, the peak including a frequency component higher than a frequency corresponding to a product of an inductance component between the power supply and the device under test and a capacitance component between the transmission path and a ground potential, and
- notify a judging section provided the test apparatus concerning the measured peak.
Dependencies are inferred from the claim text.