Electrically conductive Kelvin contacts for microcircuit tester
AssigneeJohnstech International Corporation
InventorsJoel N. Erdman, Jeffrey C. Sherry, Gary W. Michalko
Life of this patent
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AssigneeJohnstech International Corporation
InventorsJoel N. Erdman, Jeffrey C. Sherry, Gary W. Michalko
Estimating the term…
Terminals of a device under test are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact partially or completely laterally surrounds the force contact, so that it need not have its own resiliency. The sense contact has a forked end with prongs that extend to opposite sides of the force contact. Alternatively, the sense contact surrounds the force contact and slides laterally to match a lateral translation component of a lateral cross-section of the force contact during longitudinal compression of the force contact. Alternatively, the sense contact includes rods that have ends on opposite sides of the force contact, and extend parallel.
A device for forming a plurality of temporary mechanical and electrical connections between a device under test (1) having a plurality of terminals (2, 502), comprising:
A device for forming a plurality of temporary mechanical and electrical connections between a device under test (1) having a plurality of terminals (2) and a load board (3) having a plurality of contact pads (4), each contact pad (4) being laterally arranged to correspond to exactly one terminal (2), comprising:
A method of minimizing contact resistance when conducting temporary contact between a device under test (DUT) and a test fixture having test contacts, the test fixture having at least one force and sense contact, to receive the DUT test contact, the method comprising:
A device for forming a plurality of temporary mechanical and electrical connections between a device under test (1, 501) having a plurality of terminals (2,502) and a load board (3) having a plurality of contact pads (4), each contact pad (4) being laterally arranged to correspond to exactly one terminal (2), comprising:
A device for forming a plurality of temporary mechanical and electrical connections between a device under test (1) having a plurality of terminals (2) and a load board (3) having a plurality of contact pads (4), each contact pad (4) being laterally arranged to correspond to exactly one terminal (2), comprising:
Dependencies are inferred from the claim text.
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From the US filing history. Foreign family members aren’t listed.
Measuring leads; Measuring probes: measuring probes
Details: concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
With provisions for altering position, number or connection of probe tips; Adapting to differences in pitch: using an intermediate adapter, e.g.…
Measuring electric variables
About 5 years 1 month of term left · ends 5 Dec 2031 (estimated)
Not Applicable
1. Field of the Invention
The present invention is directed to equipment for testing microcircuits.
FIG. 1 is a side-view drawing of a portion of the test equipment for receiving a device under test (DUT), for standard electrical testing.
FIG. 2 is a side-view drawing of the test equipment of FIG. 1, with the DUT electrically engaged.
FIG. 3 is a side-view drawing of a portion of the test equipment for receiving a device under test (DUT), for Kelvin testing.
A general summary of the disclosure follows.
The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive contacts. The terminals may be pads, balls, wires (leads) or other contact points. Each terminal that undergoes Kelvin testing connects with both a “force” contact and a “sense” contact, with each contact electrically connecting to a respective, single contact pad on the load board. The force contact delivers a known amount of current to or from the terminal, and the sense contact measures a voltage at the terminal and draws a negligible amount of current to or from the terminal. The sense contact partially or completely laterally surrounds the force contact, so that it need not have its own resiliency, though it may also be resilient in its own right. This helps keep the force contact in alignment by preventing lateral wobbling. In a first case, the sense contact has a forked end with prongs that extend to opposite sides of the force contact. In a second case, the sense contact completely laterally surrounds the force contact and slides horizontally/laterally to match a horizontal translation component of a horizontal cross-section of the force contact during vertical compression of the force contact. In a third case, the sense contact includes two rods that have ends on opposite sides of the force contact, and extend parallel and laterally away from the force contact. In these cases, the sense contact extends horizontally along a membrane or housing that supports the force contacts. The rods may be housed in respective channels along the membrane or in the housing.
The preceding paragraph is merely a summary of the disclosure, and should not be construed as limiting in any way. The test device is described in much greater detail below.