Detector circuit and semiconductor device using same
AssigneeMitsubishi Electric Corporation
InventorsKazuya Yamamoto, Tomoyuki Asada, Miyo Miyashita
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AssigneeMitsubishi Electric Corporation
InventorsKazuya Yamamoto, Tomoyuki Asada, Miyo Miyashita
Estimating the term…
A detector circuit for detecting degradation in the distortion characteristics of a power amplifier based on signals from both ends of a coupled line of a directional coupler. The detector circuit includes a phase shifter/attenuator for phase shifting and attenuating a signal from a coupled terminal of the coupled line, a differential amplifier for outputting difference between an output signal from the phase shifter/attenuator and a signal from the isolated terminal of the coupled line, a wave detector circuit for converting the difference into a DC signal, and a comparing circuit for determining whether the voltage level of the DC signal exceeds a predetermined level. When degradation in the distortion characteristics of the power amplifier arises, the phase shifter/attenuator phase shifts the signal from the coupled terminal and outputs a signal 180° out of phase with the signal from the isolated terminal.
A detector circuit for detecting degradation in distortion characteristics of a power amplifier based on signals derived from a coupled line of a directional coupler, wherein the directional coupler includes a main line connected to the power amplifier and to an antenna, and a coupled line having a coupled terminal at a first end of the coupled line and an isolated terminal at a second end of the coupled line, said detector circuit comprising:
A semiconductor device comprising:
Dependencies are inferred from the claim text.