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US 8,558,463 B2Granted
LED matrix open/short detection apparatus and method
AssigneesPanasonic Corporation, Panasonic Semiconductor Asia Pte., Ltd.
InventorsEtsuji Sato, Chun Kiong Leslie Khoo, Jiong Fu, Maung Zabu Ko, Shuang Zhang, Muhammad S/O Abuturab
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Abstract
An apparatus to detect faulty connection of LED (open/short conditions) which may affect the function of LED display panel is presented. The apparatus basically controls the switches through control algorithm circuit to get the information of LED driver output pins voltage and compare them with two reference voltages to determine the open/short condition of individual LED.
Claims14
An apparatus for detecting an open or short condition of a light emitting diode (LED) in a LED panel, the apparatus comprising:
- a LED driver system to control the LED panel;
- a control algorithm circuit to control the LED driver system;
- a connection switches circuit to connect an output pin of the LED to a non-inverting input terminal of a comparator;
- a comparator to compare a voltage of the LED output pin with first and second reference voltages;
- a reference generation circuit to generate the first and second reference voltages,
- wherein the LED driver system includes:
- a first current source connected to a first terminal of the LED and controlled by a final from the control algorithm circuit, and
- a second current source connected to a second terminal of the LED and controlled by a signal from the control algorithm circuit.
5 more elements
Dependencies are inferred from the claim text.