Bond pad configurations for semiconductor dies
AssigneeIntersil Americas Inc.
InventorsNikhil Vishwanath Kelkar, Sagar Pushpala, Seshasayee sS. Ankireddi
Life of this patent
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Abstract
A semiconductor device is provided and includes a semiconductor die, and a plurality of bond pads having exposed surfaces arranged in an alternating interleaved pattern on the semiconductor die. Each of the surfaces of the bond pads have a first bond placement area that overlaps with a second bond placement area, with the first bond placement area having a major axis that is orthogonal to a major axis of the second bond placement area. A connecting bond is located at an intersection of the major axes of the first bond placement area and the second bond placement area on one or more of the bond pads.
Claims19
A semiconductor device, comprising:
- a semiconductor die;
- a plurality of bond pads having exposed surfaces arranged in an alternating interleaved pattern on the semiconductor die, each of the surfaces of the bond pads having a first bond placement area that overlaps with a second bond placement area, the first bond placement area having a major axis that is orthogonal to a major axis of the second bond placement area;
- and
- a connecting bond located at an intersection of the major axis of the first bond placement area and the major axis of the second bond placement area on one or more of the bond pads.
A bond pad array for a semiconductor device, comprising:
- a plurality of bond pads each having an exposed surface with a geometric shape that has at least one pair of opposing parallel sides including a first side that is longer than an opposing second side, the bond pads each having a first bond placement area that overlaps with a second bond placement area on the exposed surface, the first bond placement area having a major axis that is orthogonal to a major axis of the second bond placement area, the major axis of the first bond placement area parallel with the first side and the major axis of the second bond placement area perpendicular to the second side;
- wherein the first side is substantially equal to a dimension of a bond in a direction parallel to the oscillating motion of a bonding head and a safety zone around the bonding head, and the second side is substantially equal to a dimension of the bond in a direction perpendicular to the oscillating motion of a bonding head and the safety zone;
- and
- wherein any pair of adjacent bond pads has exposed surfaces with the same geometric shape and rotational symmetry with respect to each other, each exposed surface having only one axis of symmetry.
An electronic system, comprising:
- an integrated circuit comprising:
- a plurality of bond pads around an outer periphery of a die, the bond pads each having an exposed surface with the same non-rectangular geometric shape and rotational symmetry, the exposed surface of each of the bond pads having a first bond placement area that overlaps with a second bond placement area, the first bond placement area having a major axis that is orthogonal to a major axis of the second bond placement area;
- and
- a bond located at an intersection of the major axis of the first bond placement area and the major axis of the second bond placement area on one or more bond pads;
- wherein the exposed surfaces have an alternating interleaved pattern such that the bonds are arranged in a staggered configuration on the die;
- and
- one or more electronic components coupled to the integrated circuit.
A method of fabricating an integrated circuit, the method comprising:
- providing a semiconductor substrate;
- depositing one or more metal layers on the semiconductor substrate;
- and
- forming the one or more metal layers into a plurality of bond pads such that any pair of adjacent bond pads have surfaces with the same geometric shape and rotational symmetry with respect to each other, each of the surfaces of the bond pads having a first bond placement area that overlaps with a second bond placement area, the first bond placement area having a major axis that is orthogonal to a major axis of the second bond placement area.
Dependencies are inferred from the claim text.