Method for calculating probe mounting position in on-machine measuring device
AssigneeFanuc Corporation
InventorsYonpyo Hon, Kenzo Ebihara, Masayuki Hamura
Life of this patent
Estimating the term…
Loading patent…
AssigneeFanuc Corporation
InventorsYonpyo Hon, Kenzo Ebihara, Masayuki Hamura
Estimating the term…
A measurement program is created for measurement performed by moving X- and Z-axes so that a central axis of a probe is perpendicular to the surface of a reference sphere, and errors are obtained between original probe position data and probe position data obtained by measurement performed at two different angles θ1 and θ2 of a rotary axis according to the created measurement program. Position coordinates of a tip end of the probe at the two different angles θ1 and θ2 of the rotary axis are corrected so that the errors are zero. Then, the X- and Z-axis coordinates are corrected based on a positive or negative phased shift amount, and measurement errors are obtained by calculation. A real probe tip position is defined by the X- and Z-axis coordinates corrected by a correction amount with which the obtained measurement errors become minimum.
A method for calculating a probe mounting position in an on-machine measuring device mounted on a single rotary axis of a machine tool having at least three linear axes and the rotary axis, wherein the three linear axes extend at right angles to one another, one of the linear axes is aligned with the direction of the rotary axis, a probe of the on-machine measuring device moves at right angles to the direction of the rotary axis, a displacement of the probe is detected by a probe position detecting device mounted on the on-machine measuring device, and the distance between a rotation center of the rotary axis and a tip end of a measuring head mounted on a tip end of the probe is calculated with the tip end of the measuring head held against a reference sphere attached to the machine tool, the calculating method comprising:
A method for calculating a probe mounting position in an on-machine measuring device, comprising:
Dependencies are inferred from the claim text.