Method for magnetic screening of arrays of magnetic memories
AssigneeAvalanche Technology, Inc.
InventorsYuchen Zhou, Ebrahim Abedifard, Yiming Huai
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AssigneeAvalanche Technology, Inc.
InventorsYuchen Zhou, Ebrahim Abedifard, Yiming Huai
Estimating the term…
A testing method is described that applies a sequence external magnetic fields of varying strength to MRAM cells (such as those with MTJ memory elements) in chips or wafers to selectively screen out cells with low or high thermal stability factor. The coercivity (Hc) is used as a proxy for thermal stability factor (delta). In the various embodiments the sequence, direction and strength of the external magnetic fields is used to determine the high coercivity cells that are not switched by a normal field and the low coercivity cells that are switched by a selected low field. In some embodiment the MRAM's standard internal electric current can be used to switch the cells. Standard circuit-based resistance read operations can be used to determine the response of each cell to these magnetic fields and identify the abnormal high and low coercivity cells.
A method for testing cells in an MRAM device for abnormal thermal stability factor (delta) using coercivity as a proxy, the MRAM device having a plurality of cells that have a low resistance state and a high resistance state, the method comprising:
A method for testing cells in an MRAM device for abnormal thermal stability factor (delta) using coercivity as a proxy, the MRAM device having a plurality of cells that have a low resistance state and a high resistance state, the plurality of cells having varying coercivity that includes low coercivity cells, normal coercivity cells and high coercivity cells, the method comprising:
A method for testing cells in an MRAM device for abnormal thermal stability factor (delta) using coercivity as a proxy, the MRAM device having a plurality of cells that have a low resistance state and a high resistance state, the plurality of cells having varying coercivity that includes low coercivity cells, normal coercivity cells and high coercivity cells, the method comprising:
A method for testing cells in an MRAM device for abnormal thermal stability factor (delta) using coercivity as a proxy, the MRAM device having a plurality of cells that are switchable between a low resistance state and a high resistance state using electric current generated by circuitry in the MRAM device, the plurality of cells including low coercivity cells, normal coercivity cells and high coercivity cells, the method comprising:
Dependencies are inferred from the claim text.