Shape measurement device
AssigneeMitutoyo Corporation
InventorsKentaro Nemoto, Masaoki Yamagata, Tadashi Iwamoto, Nobuyoshi Machida
Life of this patent
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AssigneeMitutoyo Corporation
InventorsKentaro Nemoto, Masaoki Yamagata, Tadashi Iwamoto, Nobuyoshi Machida
Estimating the term…
Disclosed is a shape measurement device including: a light irradiation unit which irradiates linear light onto a work; an imaging element which images reflected light reflected by the work; and an image-forming lens which forms an image of the reflected light reflected by the work on an imaging plane of the imaging element, and a light irradiation plane of the light irradiation unit, a principal plane including a principal point of the image-forming lens, and the imaging plane of the imaging element satisfy a Scheimpflug principle. The shape measurement device further includes: an image obtaining region selection unit which divides the imaging plane of the imaging element into a plurality of regions, and selects, as an image obtaining region, a region for use in measurement from the plurality of regions in response to at least one of measurement accuracy and a size of a measurement range.
A shape measurement device comprising:
Dependencies are inferred from the claim text.