Defect inspection device using catadioptric objective lens
AssigneeHitachi, Ltd.
InventorsKeiko Yoshimizu, Yasuhiro Yoshitake
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AssigneeHitachi, Ltd.
InventorsKeiko Yoshimizu, Yasuhiro Yoshitake
Estimating the term…
A defect inspection device comprises an inspection optical system including a light source, a half mirror for reflecting illumination light emitted from the light source, a catadioptric objective lens for collecting reflected light from the sample by illumination light reflected by the half mirror, an imaging lens for focusing the reflected light transmitted through the catadioptric objective lens, a relay lens having a blocking member provided at a position at which specularly reflected light from the sample is focused by the imaging lens, and a detector for detecting specularly reflected light not blocked by the blocking member; and a computation processing unit for detecting defects of the sample on the basis of the signals detected by the detector.
A defect inspection device comprising:
A defect inspection device comprising:
A defect inspection device comprising:
Dependencies are inferred from the claim text.