Chip testing apparatus and testing method thereof
AssigneeMStar Semiconductor, Inc.
InventorsChih Hua Huang, Chih Yen Chang
Life of this patent
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Abstract
A chip testing apparatus and a chip testing method are provided. The chip testing apparatus includes a command generating module, a transceiving module and a control module. When the command generating module generates a first test command, the transceiving module transmits the first test command to a radio frequency identification (RFID) chip and receives a target test result from the RFID chip. The control module determines whether the target test result complies with a reference test result. When the determination result of the control module is no, the control module controls the command generating module to generate a second test command for retesting the RFID chip.
Claims20
A chip testing apparatus for testing a radio frequency identification (RFID) chip, comprising:
- a command generating module, for generating a first test command;
- a transceiving module, configured for:
- transmitting the first test command to the RFID chip, and
- receiving a target test result from the RFID chip;
- a reference test result providing unit, for providing a reference test result;
- and
- a control module coupled to the transceiving module and the command generating module, configured for:
- controlling the command generating module to generate the first test command;
- determining whether the target test result complies with a the reference test result;
- and
- controlling the command generating module to generate a second test command for retesting the RFID chip;
- wherein, the command generating module, the transceiving module, and the control module are modular and functionally independent.
A chip testing method for testing functionality of an RFID chip, performed by physical circuitry, comprising steps of:
- (a) generating a first test command using a modular and functionally independent first module controlled by a modular and functionally independent third module;
- (b) transmitting the first test command to the RFID chip using a modular and functionally independent second module;
- (c) receiving a target test result from the RFID chip using the second module;
- (c)(1) providing a reference test result;
- (d) determining whether the target test result complies with the reference test result using the third module;
- and
- (e) automatically generating a second test command for retesting the RFID chip using the third module.
Dependencies are inferred from the claim text.