Eddy current testing method and eddy current testing apparatus
AssigneeNippon Steel & Sumitomo Metal Corporation
InventorsShigetoshi Hyodo, Yoshiyuki Nakao
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AssigneeNippon Steel & Sumitomo Metal Corporation
InventorsShigetoshi Hyodo, Yoshiyuki Nakao
Estimating the term…
It is an object of the present invention to provide an eddy current testing apparatus capable of accurately detecting any flaws occurring in a columnar or cylindrical subject to be tested regardless of their extending directions, with the use of the same probe coil. The eddy current testing apparatus 100 according to the present invention comprises a spinning plate 1 and a probe coil 2 disposed on the spinning plate 1. The probe coil is a probe coil capable of obtaining a differential output about a scanning direction of a detection signal which corresponds to a detected eddy current induced in the subject to be tested. The spinning plate is disposed in such a position that a spinning center RC of the spinning plate faces with an axial center PC of the subject to be tested. A distance R between the spinning center of the spinning plate and a center of the probe coil is set so that a difference between a maximum amplitude of a differential output at an axially extending artificial flaw provided in the subject to be tested and a maximum amplitude of a differential output at a circumferentially extending artificial flaw provided in the subject to be tested falls within a predetermined range.
An eddy current testing method for detecting a flaw occurring in a columnar or cylindrical subject to be tested by conducting spinning scanning of a probe coil disposed to be opposite to the subject to be tested, relative to the subject to be tested, comprising the steps of:
An eddy current testing apparatus having a spinning plate and a probe coil disposed on the spinning plate and located differently from a spinning center of the spinning plate, for detecting a flaw occurring in a columnar or cylindrical subject to be tested by spinning the spinning plate disposed to be opposite to the subject to be tested, relative to the subject to be tested, thereby conducing spinning scanning of the probe coil, wherein
Dependencies are inferred from the claim text.