Testing methods for magnetic heads and magnetic storage devices assembled with the magnetic heads
AssigneeHGST Netherlands B.V.
InventorsFumiomi Ueda, Makoto Ono
Life of this patent
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AssigneeHGST Netherlands B.V.
InventorsFumiomi Ueda, Makoto Ono
Estimating the term…
In one embodiment, a manufacturing method for magnetic heads includes classifying magnetic heads into one of: a first tested head class, and a non-test-candidate head class, determining characteristic values of the magnetic heads classified in the first tested head class, estimating characteristic values of the magnetic heads classified in the non-test-candidate head class, wherein the estimating is based on the characteristic values of the magnetic heads classified in the first tested head class, classifying each of the magnetic heads classified in the non-test-candidate head class into one of: a second tested head class, and a non-test head class based on the estimated characteristic values, determining characteristic values of the magnetic heads classified in the second tested head class, and screening magnetic heads in the second tested head class based on the determined characteristic values of the magnetic heads classified in the second tested head class.
A method for testing magnetic heads, comprising:
A manufacturing method for magnetic storage device assembled with one or more magnetic heads, the method comprising:
A system, comprising:
A computer program product, the computer program product comprising:
Dependencies are inferred from the claim text.