# US 8,542,349 B2 · Arrangement and a method for controlling a measurement head of an optical measurement instrument > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 8,542,349 B2 - Document ID: US8542349B2 - Status: Granted - Kind: B2 - Application number: 13/145,652 - Filed: 2010-01-18 - Published: 2012-01-05 - Granted: 2013-09-24 - Earliest claimed: 2009-01-26 - Assignees: PerkinElmer Singapore PTE Ltd. - Applicants: Jyrki Laitinen; Markku Ojala; Jarkko Sarmaala; Christer Isaksson - Inventors: Jyrki Laitinen; Markku Ojala; Jarkko Sarmaala; Christer Isaksson - Web page: https://patentgrep.com/patent/US8542349B2 ## CPC - G01N 35/028: {having reaction cells in the form of microtitration plates} - G01N 21/6452: {Individual samples arranged in a regular 2D-array, e.g. multiwell plates} - G01N 21/13: Moving of cuvettes or solid samples to or from the investigating station {(handling materials for automatic analysis G01N35/00)} - G01N 2021/6484: {Optical fibres} - G01N 2035/0424: {Two or more linear conveyors} - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) ## Abstract An optical measurement instrument includes a measurement head and mechanical support elements arranged to support a sample well plate. The measurement head is moved towards the sample well plate and, after the measurement head has touched the sample well plate, the measurement head is moved backwards away from the sample well plate so as to provide a desired distance between the measurement head and the sample well plate. A sensor device is attached to the mechanical support elements and arranged detect a mechanical effect occurring in the mechanical support elements due to force directed by the measurement head to the sample well plate. Hence, the situation in which the measurement head touches the sample well plate can be detected without a need to provide the measurement head with a force sensor. This is advantageous because the measurement head can be a changeable module of the optical measurement instrument. ## Claims ### Claim 1 An arrangement for controlling a measurement head (101, 201) of an optical measurement instrument, the optical measurement instrument comprising first mechanical support elements (102-105) arranged to support a sample well plate (106, 206) to be received, and second mechanical support elements (107-110) arranged to support the measurement head and to allow a distance (D) from the measurement head to the sample well plate to be changed, the arrangement comprising: a controller (111, 211) arranged to make, in a situation in which the sample well plate is placed on the first mechanical support elements, the second mechanical support elements to move the measurement head towards the sample well plate and, as a response to a situation in which the measurement head touches the sample well plate, to move the measurement head backwards away from the sample well plate with a pre-determined length of movement so as to provide a pre-determined distance between the measurement head and the sample well plate, and a sensor device (112, 113, 217) arranged to detect, in the situation in which the sample well plate is placed on the first mechanical support elements, the situation in which the measurement head touches the sample well plate, wherein the sensor device is attached to the first mechanical support elements and arranged to detect, in the situation in which the sample well plate is placed on the first mechanical support elements, a mechanical effect occurring in the first mechanical support elements due to force directed by the measurement head to the sample well plate. ### Claim 2 (depends on 1) The arrangement according to claim 1, wherein the sensor device comprises a wire strain gauge (217) attached to the first mechanical support elements, the mechanical effect to be detected being a change of mechanical strain occurring in the first mechanical support elements due to the force directed by the measurement head to the sample well plate. ### Claim 3 (depends on 1) The arrangement according to claim 1, wherein the sensor device comprises an electrical contactor (112, 113) the electrical conductivity state of which is arranged to be changed as a response to a situation in which a part of the first mechanical support elements is bent due to the force directed by the measurement head to the sample well plate, the mechanical effect to be detected being bending of the part of the first mechanical support elements. ### Claim 4 (depends on 3) The arrangement according to claim 3, wherein the first mechanical support elements comprise a support rail (103) and a sledge (114) capable of receiving the sample well plate and capable of sliding along the support rail in a longitudinal direction of the support rail, the sensor device comprising an overhang (112) attached to the support rail and arranged to be turned as a response to torsion of the support rail due to the force directed by the measurement head to the sample well plate, the mechanical effect to be detected being turning of the overhang. ### Claim 5 (depends on 1) An optical measurement instrument comprising: a measurement head (101, 201), first mechanical support elements (102-105) arranged to support a sample well plate (106, 206) to be received, and second mechanical support elements (107-110) arranged to support the measurement head and to allow, in a situation in which the sample well plate is placed on the first mechanical support elements, a distance from the measurement head to the sample well plate to be changed, wherein the optical measurement instrument further comprises the arrangement according to claim 1 for controlling, in the situation in which the sample well plate is placed on the first mechanical support elements, the position of the measurement head relative to the sample well plate. ### Claim 6 A method for controlling a measurement head of an optical measurement instrument, and the optical measurement instrument comprising first mechanical support elements arranged to support a sample well plate to be received, and second mechanical support elements arranged to support the measurement head and to allow a distance from the measurement head to the sample well plate to be changed, the method comprising: moving (301) the measurement head towards the sample well plate placed on the first mechanical support elements, detecting (302) a situation in which the measurement head touches the sample well plate, and as a response to the situation in which the measurement head touches the sample well plate, moving (303) the measurement head backwards away from the sample well plate with a pre-determined length of movement so as to provide a pre-determined distance between the measurement head and the sample well plate, wherein the situation in which the measurement head touches the sample well plate is detected by detecting (301), with a sensor device attached to the first mechanical support elements, a mechanical effect occurring in the first mechanical support elements due to force directed by the measurement head to the sample well plate. ### Claim 7 (depends on 6) The method according to claim 6, wherein the mechanical effect occurring in the first mechanical support elements is detected with a wire strain gauge attached to the first mechanical support elements, the mechanical effect to be detected being a change of mechanical strain occurring in the first mechanical support elements due to the force directed by the measurement head to the sample well plate. ### Claim 8 (depends on 6) The method according to claim 6, wherein the mechanical effect occurring in the first mechanical support elements is detected with an electrical contactor the electrical conductivity state of which is changed as a response to a situation in which a part of the first mechanical support elements is bent due to the force directed by the measurement head to the sample well plate, the mechanical effect to be detected being bending of the part of the first mechanical support elements. ### Claim 9 (depends on 6) The method according to claim 6, wherein the first mechanical support elements comprise a support rail and a sledge capable of receiving the sample well plate and capable of sliding along the support rail in a longitudinal direction of the support rail, and the mechanical effect occurring in the first mechanical support elements is detected with an overhang attached to the support rail and arranged to be turned as a response to torsion of the support rail due to the force directed by the measurement head to the sample well plate, the mechanical effect to be detected being turning of the overhang. ### Claim 10 (depends on 1) The arrangement according to claim 1, wherein the sample well plate is a microtitration plate. ### Claim 11 (depends on 1) The arrangement according to claim 1, wherein samples stored in the sample well plate are movable in an xy plane. ### Claim 12 (depends on 1) The arrangement according to claim 1, wherein the second mechanical support elements comprise threaded rods. ### Claim 13 (depends on 12) The arrangement according to claim 12, wherein counterparts of the threaded rods comprise servomotors arranged to move the measurement head in a positive or negative z direction. ### Claim 14 (depends on 6) The method according to claim 6, wherein the sample well plate is a microtitration plate. ### Claim 15 (depends on 6) The method according to claim 6, wherein samples stored in the sample well plate are movable in an xy plane. ### Claim 16 (depends on 6) The method according to claim 6, wherein the second mechanical support elements comprise threaded rods. ### Claim 17 (depends on 16) The method according to claim 16, wherein counterparts of the threaded rods comprise servomotors arranged to move the measurement head in a positive or negative z direction.