# US 8,542,053 B2 · High-linearity testing stimulus signal generator

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- Number: US 8,542,053 B2
- Document ID: US8542053B2
- Status: Granted
- Kind: B2
- Application number: 13/092,531
- Filed: 2011-04-22
- Published: 2012-10-25
- Granted: 2013-09-24
- Earliest claimed: 2011-04-22
- Assignees: National Yunlin University of Science and Technology
- Applicants: Chun-Wei Lin; Yi-Cang Wu
- Inventors: Chun-Wei Lin; Yi-Cang Wu
- Web page: https://patentgrep.com/patent/US8542053B2

## CPC

- G06G 7/26: Arbitrary function generators (using orthogonal functions, e.g. Fourier series, G06G7/19)
- G06G: ANALOGUE COMPUTERS (analogue optical computing devices G06E3/00)

## Abstract

A high-linearity testing stimulus signal generator comprises a signal collection unit receiving an input current signal, a waveform conversion unit connecting with the signal collection unit, a first voltage-to-current conversion unit connecting with the waveform conversion unit, a delay unit connecting with the waveform conversion unit, a second voltage-to-current conversion unit connecting with the delay unit, a current comparison unit connecting respectively with the first voltage-to-current conversion unit and the second voltage-to-current conversion unit, an error calculation unit connecting with the current comparison unit, and a compensation unit connecting with the error calculation unit. The above-mentioned structure forms a feedback mechanism to perform compensation adjustment to promote the linearity of the output signals. Thus, the present invention can generate high-accuracy testing stimulus signals.

## Claims

### Claim 1

A high-linearity testing stimulus signal generator comprising
a signal collection unit receiving an input current signal;
a waveform conversion unit connecting with the signal collection unit, converting the signal output by the signal collection unit into a triangular wave voltage signal, and outputting the triangular wave voltage signal via a voltage output terminal;
a first voltage-to-current conversion unit connecting with the voltage output terminal of the waveform conversion unit and converting the triangular wave voltage signal into a first current signal;
a delay unit connecting with the voltage output terminal of the waveform conversion unit and delaying propagation time of the triangular wave voltage signal;
a second voltage-to-current conversion unit connecting with the delay unit and converting the delayed triangular wave voltage signal into a second current signal;
a current comparison unit connecting respectively with the first voltage-to-current conversion unit and the second voltage-to-current conversion unit to receive the first current signal and the second current signal and then perform comparison thereof to output a current difference signal;
an error calculation unit connecting with an output terminal of the current comparison unit to receive the current difference signal and perform error calculation to output an error signal; and
a compensation unit connecting with the error calculation unit to receive the error signal and perform signal compensation to output a compensation signal to the signal collection unit.

### Claim 2 (depends on 1)

The high-linearity testing stimulus signal generator according to claim 1, wherein the current comparison unit is a current subtractor performing subtraction of the first current signal and the second current signal to output the current difference signal.

### Claim 3 (depends on 1)

The high-linearity testing stimulus signal generator according to claim 1 further comprising a reference current output unit connecting with an input terminal of the error calculation unit and providing a reference signal for the error calculation unit to perform the error calculation.

### Claim 4 (depends on 3)

The high-linearity testing stimulus signal generator according to claim 3, wherein the reference signal is a current signal, and wherein the error calculation unit is a current subtractor, which performs subtraction of the reference signal and the current difference signal to output the error signal.

### Claim 5 (depends on 4)

The high-linearity testing stimulus signal generator according to claim 4, wherein the error signal is a current signal.

### Claim 6 (depends on 1)

The high-linearity testing stimulus signal generator according to claim 1, wherein the compensation unit performs multiple amplification to the error signal to obtain the compensation signal.