# US 8,542,002 B2 · System and method for performing power spectral density and power level measurements

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- Number: US 8,542,002 B2
- Document ID: US8542002B2
- Status: Granted
- Kind: B2
- Application number: 12/848,332
- Filed: 2010-08-02
- Published: 2011-02-03
- Granted: 2013-09-24
- Earliest claimed: 2009-07-31
- Assignees: Tektronix, Inc.
- Applicants: P E Ramesh; John J. Pickerd
- Inventors: P E Ramesh; John J. Pickerd
- Web page: https://patentgrep.com/patent/US8542002B2

## CPC

- G01R 13/02: for displaying measured electric variables in digital form
- H04B 3/487: Testing crosstalk effects
- G01R 23/16: Spectrum analysis; Fourier analysis
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- H04B: TRANSMISSION

## Abstract

A system and method for performing power spectral density (PSD) and power level measurements for measuring PSD required by 10GBaseT applications, using a single test and measurement instrument, such as a real time oscilloscope is described. That is, an oscilloscope includes processing circuitry which receives an input signal and converts it to raw data, it then transforms the raw data into specific analyzed displayable data by algorithmically deriving PSD from spectral data and plotting the PSD data along with limit values on a display screen of the oscilloscope.

## Claims

### Claim 1

A method for use in an oscilloscope for performing power spectral density (PSD) and power level measurements, the method comprising the steps of:
algorithmically deriving PSD data from spectral data and plotting the PSD data on the oscilloscope along with limit values;
calculating a power value of the signal from the PSD data for a user selectable frequency range;
plotting a PSD curve on a reference channel of the oscilloscope with the limit values; and
displaying on a display screen of the oscilloscope a pass result if the PSD curve is within the limit values and a fail result if the PSD curve is not within the limit values.

### Claim 2 (depends on 1)

The method as in claim 1, wherein the pass result and fail result enable a user to use only the oscilloscope for all measurements including sample rate, record length, resolution, bandwidth, windowing, and averaging to perform 10GBASE-T testing.

### Claim 3 (depends on 1)

The method as in claim 1, wherein the measured PSD data on the oscilloscope is comparable to measured PSD data of a spectrum analyzer.

### Claim 4 (depends on 1)

The method as in claim 1, wherein the PSD data is measured by the formula derived as PSD=20*log 10 (Z)−50+1.05,
wherein:
Z=Filter (Y),
Y
=
1
m
⁢
∑
i
=
0
m
⁢
Yi
,
Yi=Xi(0)+2*Xi(n) where n varies from 1 to N/2−1,
Xi=FFT(xi), i is ith waveform, and
x is a signal and X is a spectrum of the signal.

### Claim 5 (depends on 1)

The method as in claim 1, wherein the power value is measured by the formula derived as Power (in dBm)=10*log 10(linarea)+1.05,
wherein:
linarea=trapz(frequency(1,a_start:a_end),PSdLin(1,a_start:a_end)), and
a_start and a_end define a frequency range interval from 1 MHz to 3 GHz.

### Claim 6 (depends on 1)

The method as in claim 1, wherein a MATLAB™ algorithm is used to derive the power value from the PSD data.

### Claim 7 (depends on 1)

The method as in claim 1, wherein an algorithm is used to represent the PSD curve, said algorithm being Math1=10*log(Math3)−50+1.05,
wherein Math3=AVG(spect(Ch1)) with spectral setup as 1 MHz RBW, and span is set to 3 GHz.

### Claim 8 (depends on 7)

The method as in claim 7, wherein the power value can be calculated by a mathematical function set on the oscilloscope as:
Math4=10*log (Intg(Math3*Math3)/(0.001*100*1×106))+1.05
wherein measuring the maximum on a Math4 waveform gives the power value.

### Claim 9

A system for use in an oscilloscope for making power spectral density (PSD) and power level measurements, the system comprising:
an oscilloscope receiving an input signal and converting said input signal to raw data, and said oscilloscope having a display screen;
said oscilloscope having processing circuitry, said processing circuitry transforming said raw data into specific analyzed displayable data by algorithmically deriving PSD data from spectral data and plotting the PSD data along with limit values on said display screen;
said oscilloscope processing circuitry calculating a power value of the signal from the PSD data for a user selectable frequency range;
said oscilloscope processing circuitry plotting a PSD curve on a reference channel of said oscilloscope with limit values; and
providing a pass result if the PSD curve is within the limit values and a fail result if the PSD curve is outside the limit values; and
displaying the pass result or fail result on said display screen of said oscilloscope.