# US 8,541,858 B2 · Solid state imaging device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 8,541,858 B2 - Document ID: US8541858B2 - Status: Granted - Kind: B2 - Application number: 13/052,297 - Filed: 2011-03-21 - Published: 2011-11-10 - Granted: 2013-09-24 - Earliest claimed: 2010-05-06 - Assignees: Kabushiki Kaisha Toshiba - Applicants: Koichi Kokubun - Inventors: Koichi Kokubun - Web page: https://patentgrep.com/patent/US8541858B2 ## CPC - H10F 39/026: {Wafer-level processing} - H10F 39/806: {Optical elements or arrangements associated with the image sensors} - H10K 39/32: Organic image sensors - H10F: INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION - H10K: ORGANIC ELECTRIC SOLID-STATE DEVICES ## Abstract A solid state imaging device includes: a first photoelectric conversion layer of an organic material; a second photoelectric conversion layer of an inorganic material; a third photoelectric conversion layer of an inorganic material; a first filter of an inorganic material; a second filter of an inorganic material. The first photoelectric conversion layer photoelectrically-converts a light of a first color. The first filter is disposed between the first photoelectric conversion layer and the second photoelectric conversion layer to selectively guide a light of a second color, out of a light that passed through the first photoelectric conversion layer, to the second photoelectric conversion layer. The second filter being disposed between the first photoelectric conversion layer and the third photoelectric conversion layer to selectively guide a light of a third color, out of the light that passed through the first photoelectric conversion layer, to the third photoelectric conversion layer. ## Claims ### Claim 1 A solid state imaging device comprising: a first photoelectric conversion layer of an organic material, the first photoelectric conversion layer photoelectrically-converting a light of a first color; a second photoelectric conversion layer of an inorganic material; a third photoelectric conversion layer of an inorganic material, the third photoelectric conversion layer being disposed adjacent to the second photoelectric conversion layer in terms of a direction along the first photoelectric conversion layer; a first filter of an inorganic material, the first filter being disposed between the first photoelectric conversion layer and the second photoelectric conversion layer to selectively guide a light of a second color, out of a light that passed through the first photoelectric conversion layer, to the second photoelectric conversion layer; and a second filter of an inorganic material, the second filter being disposed between the first photoelectric conversion layer and the third photoelectric conversion layer to selectively guide a light of a third color, out of the light that passed through the first photoelectric conversion layer, to the third photoelectric conversion layer. ### Claim 2 (depends on 1) The device according to claim 1, wherein each of the first and second filters is structured in such a manner that a first insulation layer and a second insulation layer are alternately laminated a plurality of times, the second insulation layer having a refractive index larger than that of the first insulation layer. ### Claim 3 (depends on 2) The device according to claim 2, wherein each of the first and second filters includes the first insulation layer serving as a spacer layer, and wherein the spacer layers of the first and second filters are different in thickness from each other, and the corresponding insulations layers excluding the spacer layers of the first and second filters are equal in thickness to each other. ### Claim 4 (depends on 3) The device according to claim 3, wherein the first insulation layer is formed with use of a material containing titanium oxide as a main component, and wherein the second insulation layer is formed with use of a material containing silicon oxide as a main component. ### Claim 5 (depends on 3) The device according to claim 3, wherein the upper surfaces of the first and second filters are different in height from a semiconductor substrate, and wherein the solid state imaging device further comprises an organic insulation film covering one filter out of the first and second filters, the one filter having the upper surface being lower in height from the semiconductor substrate than the upper surface of the other filter. ### Claim 6 (depends on 2) The device according to claim 2, wherein the first insulation layers of the first and second filters are different in thickness and the second insulation layers of the first and second filters are different in thickness. ### Claim 7 (depends on 6) The device according to claim 6, wherein the first insulation layer is formed with use of a material containing silicon oxide as a main component, and wherein the second insulation layer is formed with use of silicon nitride as a main component. ### Claim 8 (depends on 1) The device according to claim 1, wherein each of the first and second filters is structured such that quantum dots are formed in an insulation film, and wherein the quantum dots of the first and second filters are different in diameter from each other. ### Claim 9 (depends on 8) The device according to claim 8, wherein the insulation film is made of a material containing silicon oxide as a main component, and wherein quantum dots are made of a material containing silicon as a main component. ### Claim 10 (depends on 1) The device according to claim 1, wherein each of the second and third photoelectric conversion layers is made of a material containing, as a main component, a component selected from the group consisting of silicon, cadmium sulfide, cadmium selenide, lead sulfide, and lead selenide. ### Claim 11 (depends on 10) The device according to claim 10, wherein each of the second and third photoelectric conversion layers is a momocrystalline, polycrystalline, or amorphous layer of the material. ### Claim 12 (depends on 1) The device according to claim 1, wherein the second and third photoelectric conversion films are made of the same material. ### Claim 13 (depends on 12) The device according to claim 12, wherein each of the second and third photoelectric conversion layers is made of an inorganic material having a property of absorbing a light of wavelengths in a whole wavelength range of visible light. ### Claim 14 (depends on 1) The device according to claim 1, wherein the second and third photoelectric conversion layers are photodiodes including a P type layer and an N type layer, respectively. ### Claim 15 (depends on 1) The device according to claim 1, further comprising: pixel electrode films disposed between the first photoelectric conversion layer and the second photoelectric conversion layer and between the first photoelectric conversion layer and the third photoelectric conversion layer, respectively, so as to be covered with the first photoelectric conversion layer, and plugs extending from the pixel electrode films via the first and second filters toward a semiconductor substrate. ### Claim 16 (depends on 14) The device according to claim 14, further comprising: a second insulation film extending between the first photoelectric conversion layer and a plug and between the second photoelectric conversion layer and a plug, wherein the plugs extends via the second insulation film between the first and second photoelectric conversion layers toward the semiconductor substrate. ### Claim 17 (depends on 1) The device according to claim 1, further comprising: a semiconductor substrate including a front surface with an active region disposed therein and a back surface at which a buried oxide layer is exposed to the outside, wherein the first photoelectric conversion layer is disposed on a side of the back surface of the semiconductor substrate, wherein the second photoelectric conversion layer is disposed between the first photoelectric conversion layer and the semiconductor substrate, wherein the third photoelectric conversion layer is disposed adjacent to the second photoelectric conversion layer in terms of a direction along the first photoelectric conversion layer, and is disposed between the first photoelectric conversion layer and the semiconductor substrate, wherein the first filter is disposed on the side of the back surface of the semiconductor substrate between the first photoelectric conversion layer and the second photoelectric conversion layer, and wherein the second filter is disposed on the side of the back surface of the semiconductor substrate between the first photoelectric conversion layer and the third photoelectric conversion layer. ### Claim 18 (depends on 17) The device according to claim 17, further comprising: pixel electrode films disposed between the first photoelectric conversion layer and the second photoelectric conversion layer and between the first photoelectric conversion layer and the third photoelectric conversion layer, respectively, so as to be covered with the first photoelectric conversion layer; an insulation film of an inorganic material, the insulation film being disposed between the second photoelectric conversion layer and the second photoelectric conversion layer; and plugs extending from the pixel electrode film through between the insulation film and the buried oxide layer to the active region. ### Claim 19 (depends on 1) The device according to claim 1, wherein the first photoelectric conversion layer is disposed on a side of the back surface of an inorganic semiconductor substrate, wherein the second photoelectric conversion layer is disposed in at least a first back surface portion within the semiconductor substrate, wherein the third photoelectric conversion layer is disposed adjacent to the second photoelectric conversion layer in terms of a direction along the first photoelectric conversion layer and disposed in at least a second back surface portion within the semiconductor substrate, wherein the first filter is disposed on the side of the back surface of the semiconductor substrate between the first photoelectric conversion layer and the second photoelectric conversion layer, and wherein the second filter is disposed on the side of the back surface of the semiconductor substrate between the first photoelectric conversion layer and the third photoelectric conversion layer. ### Claim 20 (depends on 19) The device according to claim 19, further comprising: pixel electrode films disposed between the first photoelectric conversion layer and the second photoelectric conversion layer and between the first photoelectric conversion layer and the third photoelectric conversion layer, respectively; an insulation member of an inorganic material, the insulation member being disposed between the second photoelectric conversion layer and the third photoelectric conversion layer within the semiconductor substrate; a semiconductor region disposed on a side of a front surface of the insulation member within the semiconductor substrate; and plugs extending from the pixel electrode film via between the first filter and the second filter through the insulation member to the semiconductor region.