# US 8,541,746 B2 · Process and system for the nondestructive quality determination of a weld seam, and a welding device

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- Number: US 8,541,746 B2
- Document ID: US8541746B2
- Status: Granted
- Kind: B2
- Application number: 12/620,176
- Filed: 2009-11-17
- Published: 2010-05-20
- Granted: 2013-09-24
- Earliest claimed: 2008-11-20
- Assignees: Benteler Automobiltechnik GmbH
- Applicants: Thorsten Andres; Sven Przybylski
- Inventors: Thorsten Andres; Sven Przybylski
- Web page: https://patentgrep.com/patent/US8541746B2

## CPC

- G01N 25/72: Investigating presence of flaws
- B23K 9/0956: {using sensing means, e.g. optical}
- B23K 31/125: {Weld quality monitoring}
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- B23K: SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM

## Abstract

A process for the non-destructive determination of the quality of a weld seam, the process steps comprising: providing a first and a second component; connecting the first and second components by a weld seam produced by a welding operation; and measuring a surface temperature of the weld seam and surface temperatures of areas of the first and second components adjacent to the weld seam that were heated by the welding operation. A system for carrying out the process for the non-destructive determination of the quality of a weld seam, the system comprising: a measuring device, an analyzing unit, and a welding device.

## Claims

### Claim 1

A process for the non-destructive determination of the quality of a weld seam, the process steps comprising:
providing a first and a second component;
connecting the first and second components by a weld seam produced by a welding operation;
measuring a surface temperature of the weld seam and surface temperatures of areas of the first and second components adjacent to the weld seam that were heated by the welding operation;
establishing a location-dependent heat profile from the measured surface temperatures;
comparing the location-dependent heat profile with a desired profile;
wherein the temperature measuring takes place perpendicular to a longitudinal dimension of the weld seam;
wherein the temperature measuring takes place in a non-contact manner by detection of the emitted heat radiation;
wherein the temperature measuring takes place by a measuring device which detects the heat radiation, in a line-by-line manner, emitted by the weld seam and the areas of the first component and the second component adjacent to the weld seam; and
wherein the measuring device detecting the heat radiation moves at the same speed along the weld seam as a tool producing the weld seam.

### Claim 2 (depends on 1)

The process according to claim 1, wherein the line-by-line manner of detection of the heat radiation takes place perpendicular to a longitudinal dimension of the weld seam.

### Claim 3

A system for carrying out a process for the non-destructive determination of the quality of a weld seam, the system comprising:
a measuring device to measure the surface temperatures;
an analyzing unit to establish the location-dependent heat profile and to compare the location-dependent heat profile with the desired profile;
wherein the measuring device includes a detector to detect heat radiation;
wherein the measuring device is movable along the weld seam;
further comprising a welding device to produce the weld seam between the first and second components; and
wherein the welding device is a movable tool and the measuring device is movable at a constant distance behind the movable tool producing the weld seam.

### Claim 4 (depends on 3)

The system according to claim 3, wherein the detector is constructed as a line sensor or as a matrix sensor.

### Claim 5 (depends on 3)

The system according to claim 3, wherein the detector includes a spectral sensitivity in a close infrared region.

### Claim 6 (depends on 3)

The system according to claim 3, wherein the detector is constructed as a CCD sensor.

### Claim 7 (depends on 6)

The system according to claim 6, wherein the measuring device includes an objective lens to image emitted radiation onto the CCD sensor.