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US 8,527,820 B2Granted
Semiconductor device and test method thereof
AssigneeElpida Memory, Inc.
InventorShin Ito
Life of this patent
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Abstract
A semiconductor device includes a first management area storing a plurality of inspection results, the plurality of inspection results being obtained by executing inspections for each of a plurality of storage areas which store a plurality of data; and a second management area storing the plurality of inspection results. The first and second management areas are independent from each other.
Claims32
A semiconductor device comprising:
- a NAND type flash memory array including a plurality of storage areas, as memory blocks, which store a plurality of data;
- a first management area storing a plurality of inspection results regarding whether or not each of the memory blocks of the NAND type flash memory array is a bad memory block, the plurality of inspection results being obtained by executing inspections for each of the storage areas;
- and
- a second management area storing the plurality of inspection results, the first and second management areas being independent from each other.
1 more element
A semiconductor device comprising:
- a plurality of first management areas corresponding to a plurality of storage areas storing a plurality of inspection results, the plurality of inspection results being obtained by executing inspections for each of a plurality of storage areas which store a plurality of data;
- a plurality of second management areas corresponding to a plurality of storage areas storing the plurality of inspection results, the first and second management areas being independent from each other,
- wherein the semiconductor device stores the plurality of first inspection results respectively corresponding to the plurality of storage areas into at least the plurality of second management areas.
A semiconductor device comprising:
- a plurality of main storage areas storing data;
- a plurality of first management areas corresponding to the plurality of main storage areas respectively, the plurality of first management areas storing a plurality of failure information indicating whether the plurality of main storage areas are failure areas or non-failure areas;
- and
- a plurality of second management areas respectively indicating whether the plurality of main storage areas are failure areas or non-failure areas, the plurality of second management areas corresponding to the plurality of main storage areas respectively,
- wherein the plurality of first management areas respectively store a plurality of failure information formed by respectively merging a plurality of first inspection results and a plurality of second inspection results, the plurality of first inspection results are obtained by executing a first inspection, the plurality of second inspection results are obtained by executing a second inspection after the first inspection is executed, and
- the plurality of second management areas respectively store the first inspection results without storing the second inspection results.
3 more elements
A semiconductor test method comprising:
- testing a first inspection with a plurality of storage areas, the first inspection resulting a plurality of first inspection results, the plurality of storage areas storing a plurality of data;
- storing the plurality of first inspection results into at least a plurality of second management areas among a plurality of first management areas and the plurality of second management areas corresponding to the plurality of storage areas;
- reading the plurality of first inspection results from the plurality of second management areas;
- testing a second inspection after the first inspection is executed, the second inspection being executed to a plurality of non-failure areas in the plurality of storage areas based on the plurality of first inspection results of the second management areas, the first inspection results indicate whether the plurality of storage areas are non-failure areas or failure areas;
- and
- storing a plurality of second inspection results that relating the second inspection respectively corresponding to the plurality of non-failure areas of the plurality of storage area into the plurality of first management areas.
3 more elements
Dependencies are inferred from the claim text.