Test systems with multiple antennas for characterizing over-the-air path loss
AssigneeApple Inc.
InventorsThomas W. Chang, Peter Bevelacqua
Life of this patent
Estimating the term…
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AssigneeApple Inc.
InventorsThomas W. Chang, Peter Bevelacqua
Estimating the term…
Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test chamber with multiple antennas, and radio-frequency (RF) cables that connect the test unit to the multiple antennas within the test chamber. Reference devices under test (DUTs) may be used to calibrate the OTA path loss of each test station while switching one of the multiple antennas into use one at a time at desired frequencies. A preferred antenna list indicating the preferred antenna that provides the optimal path loss for each desired frequency may be generated. Once calibrated, the test stations may be used during product testing to test factory DUTs to determine whether a particular production DUT satisfies pass/fail criteria. During product testing, a selected one of the multiple antennas is enabled based on the preferred antenna list to perform desired measurements.
A method for performing wireless testing with a test station during manufacturing, wherein the test station includes a test chamber having a plurality of test chamber antennas, a test unit, and radio-frequency cables that connect the test chamber antennas to the test unit, the method comprising:
A test system that includes a test station, wherein the test station comprises:
A test system for making wireless measurements on devices under test, wherein the test system includes a wireless test station and wherein the wireless test station comprises:
A method of calibrating wireless test equipment that includes a test chamber having a plurality of antennas for wirelessly testing devices under test during manufacturing to determine whether the devices under test are performing satisfactorily, comprising:
A method of using wireless test equipment that includes a test chamber having a plurality of antennas to wirelessly test devices under test during manufacturing to determine whether the devices under test are performing satisfactorily, comprising:
Dependencies are inferred from the claim text.