Variable resistance memory device and related method of operation
AssigneeSamsung Electronics Co., Ltd.
InventorsDeok-kee Kim, Ho Jung Kim
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AssigneeSamsung Electronics Co., Ltd.
InventorsDeok-kee Kim, Ho Jung Kim
Estimating the term…
A variable resistance memory device comprises a memory cell comprising a variable resistance device and a select transistor connected in series to the variable resistance device. The variable resistance memory device further comprises a write driver for supplying a write voltage to opposite sides of the memory cell, and a feedback circuit for detecting a resistance change of the variable resistance device and controlling a gate voltage of the select transistor according to the detected resistance change.
A variable resistance memory device, comprising:
A method of performing a write operation of a variable resistance memory device comprising a memory cell comprising a variable resistance device and a select transistor connected in series with the variable resistance device, the method comprising:
Dependencies are inferred from the claim text.
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Arrangements for selecting an address in a digital store: word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down…
Using resistive RAM [RRAM] elements: comprising amorphous/crystalline phase transition cells
Using resistive RAM [RRAM] elements: comprising metal oxide memory material, e.g. perovskites
Auxiliary circuits: verifying circuits or methods
About 5 years of term left · ends 12 Oct 2031 (estimated)
Embodiments of the inventive concept relate generally to semiconductor memory devices. More particularly, embodiments of the inventive concept relate to variable resistance memory devices and related methods of operation.
Semiconductor memory devices can be roughly divided into two categories according to whether they retain stored data when disconnected from power. These categories include volatile memory devices, which lose stored data when disconnected from power, and nonvolatile memory devices, which retain stored data when disconnected from power.
In recent years, there has been a steady increase in the demand for nonvolatile memory devices capable of high speed operation and high storage capacity. This demand has been addressed to a certain extent by the widespread adoption of flash memory. However, researchers continue to explore additional types of nonvolatile memory devices with the potential for improved performance and data storage capacity. Examples of these additional types of nonvolatile memory devices include ferroelectric random access memory (FRAM), magnetoresistive random access memory (MRAM), phase change random access memory (PRAM), and resistive random access memory (RRAM).
The drawings illustrate selected embodiments of the inventive concept. In the drawings, like reference numbers indicate like features.
FIG. 1 is a diagram illustrating a structure of a variable resistance memory cell.
FIG. 2 is a diagram illustrating a variable resistance memory device according to an embodiment of the inventive concept.
Embodiments of the inventive concept are described below with reference to the accompanying drawings. These embodiments are presented as teaching examples and should not be construed to limit the scope of the inventive concept.
FIG. 1 is a diagram illustrating a structure of a variable resistance memory cell.
Referring to FIG. 1, the variable resistance memory cell comprises a variable resistance device 10 and a select device 20.