Anti-fuse circuit
AssigneeElite Semiconductor Memory Technology Inc.
InventorMing-Chien Huang
Life of this patent
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Abstract
An anti-fuse circuit including a programmable module, a read module, and a control module is provided. The programmable module has a plurality of data cells. The read module is coupled to the programmable module. During a normal operation, the read module distinguishes which one or more of the data cells are stressed. The control module is coupled to the programmable module. During a stress operation, the control module controls each stressed data cell to be coupled to a high voltage, a low voltage, and a control voltage. The first end of each stressed data cells is coupled to the low voltage, the second end of each stressed data cells is coupled to the high voltage, and the control end of each stressed data cells is coupled to the control voltage during the stress operation.
Claims17
An anti-fuse circuit, comprising:
- a programmable module coupled to a high voltage, a low voltage, and a control voltage and comprising a plurality of data cells, wherein each of the data cells has a first end, a second end, and a control end;
- a read module coupled to the programmable module, and during a normal operation, the read module distinguishing which one or more of the data cells are stressed;
- and
- a control module coupled to the programmable module, and during a stress operation, the control module controlling each stressed data cell to be coupled to the high voltage, the low voltage, and the control voltage,
- wherein the first end of each stressed data cell is coupled to the low voltage, the second end of the each stressed data cell is coupled to the high voltage, and the control end of the each stressed data cell is coupled to the control voltage during the stress operation.
Dependencies are inferred from the claim text.