Test apparatus and test method for A/D converter
AssigneeAdvantest Corporation
InventorsKoji Asami, Yasuo Furukawa
Life of this patent
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Abstract
A test apparatus configured to test an N-bit (N represents an integer) A/D converter is provided. A voltage generating unit outputs a 2N-valued analog voltage to the A/D converter. A capture unit captures an output code of the A/D converter for each level. A signal processing unit compares the output code captured for each level with the corresponding expected value code, corrects the value of the analog voltage for each level based upon the comparison result, and outputs the corrected analog voltage to the voltage generating unit.
Claims11
A test apparatus for an N-bit (N represents an integer) A/D converter, the test apparatus comprising:
- a voltage generating unit configured to output a 2N-valued analog voltage to the A/D converter;
- a capture unit configured to capture an output code for each level output from the A/D converter;
- and
- a signal processing unit configured to compare the output code captured for each level with a corresponding expected value code, to correct the value of an analog voltage for each level based upon the comparison result, and to output the corrected analog voltage to the voltage generating unit.
A test method for an N-bit (N represents an integer) A/D converter, the test method comprising:
- outputting a 2N-valued analog voltage to the A/D converter each time incrementing a variable i (i represents an integer);
- capturing an output code for each level output from the A/D converter;
- and
- comparing the output code captured for each level with a corresponding expected value code, and correcting the value of the analog voltage for each level according to the comparison result,
- wherein the aforementioned processing is repeatedly executed.
Dependencies are inferred from the claim text.