Shallow trench isolation structure and method for forming the same
AssigneeInstitute of Microelectronics, Chinese Academy of Sciences
InventorsHuicai Zhong, Qingqing Liang, Haizhou Yin
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Abstract
The invention provides a STI structure and method for forming the same. The STI structure includes a semiconductor substrate; a first trench embedded in the semiconductor substrate and filled up with a first dielectric layer; and a second trench formed on a top surface of the semiconductor substrate and interconnected with the first trench, wherein the second trench is filled up with a second dielectric layer, a top surface of the second dielectric layer is flushed with that of the semiconductor substrate, and the second trench has a width smaller than that of the first trench. The invention reduces dimension of divots and improves performance of the semiconductor device.
Claims4
A shallow trench isolation (STI) structure, comprising:
- a first semiconductor substrate;
- a first trench formed on a bottom surface of the first semiconductor substrate and filled up with a first dielectric layer, wherein the first dielectric layer covers the bottom surface of the first semiconductor substrate;
- a second trench formed on a top surface of the first semiconductor substrate and interconnected with the first trench, wherein the second trench is filled up with a second dielectric layer, a top surface of the second dielectric layer is flushed with that of the first semiconductor substrate, and the second trench has a width smaller than that of the first trench;
- and
- a second semiconductor substrate and a third dielectric layer formed on a top surface of the second semiconductor substrate, wherein the third dielectric layer is bonded with the first dielectric layer which covers the bottom surface of the first semiconductor substrate.
Dependencies are inferred from the claim text.