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US 8,525,136 B2Granted
Work piece with concealed surface defects
AssigneeIntel Corporation
InventorSergei Voronov
Life of this patent
Estimating the term…
Abstract
Methods for concealing random or uncontrolled surface defects from a work piece surface are provided, by applying a plurality of induced controlled defects over the random defects to alter the surface texture.
Claims20
An apparatus comprising a work piece having a pattern of induced defects on at least one surface thereof for concealing a previously existing random defect(s).
An apparatus formed by the method comprising:
- applying a plurality of induced defects on a first portion of a surface of a work piece to conceal a plurality of random defects on the surface.
An apparatus formed by a method comprising:
- irradiating a surface of a work piece selected from an integrated heat sink and a semiconductor die with a plurality of laser pulses to form a plurality of pits on the surface, wherein the pits alter a texture of the surface, so as to conceal a previously existing random defect(s).
Dependencies are inferred from the claim text.