Liquid metal ion source and secondary ion mass spectrometric method and use thereof
AssigneeIon-Tof Technologies GmbH
InventorsFelix Kollmer, Peter Hoerster, Andreas Duetting
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Abstract
A liquid metal ion source for use in an ion mass spectrometric analysis method contains, on the one hand, a first metal with an atomic weight ≧190 U and, on the other hand, another metal with an atomic weight ≦90 U. One of the two types of ions are filtered out alternately from the primary ion beam and directed onto the target as a mass-pure primary ion beam.
Claims19
Liquid metal ion source which contains bismuth in an alloy, wherein the alloy contains a further metal with an atomic weight ≦90 u, a solubility in bismuth ≧1%, with few or no isotopes or with an narrow isotope distribution and which, during the ion beam production, forms no or only small quantities of mixed clusters with bismuth.
Liquid metal ion source which contains bismuth in an alloy, wherein the alloy contains manganese as a further metal.
Dependencies are inferred from the claim text.