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US 8,525,111 B1Granted
High pressure mass spectrometry systems and methods
Assignee908 Devices Inc.
InventorsChristopher D. Brown, Michael Jobin, Kevin J. Knopp, Evgeny Krylov, Scott Miller
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Abstract
Mass spectrometers and methods for measuring information about samples using mass spectrometry are disclosed.
Claims30
A mass spectrometer, comprising:
- an ion source;
- an ion trap;
- an ion detector;
- a gas pressure regulation system comprising a single mechanical pump;
- and
- a controller connected to the ion source, the ion trap, and the ion detector,
- wherein during operation of the mass spectrometer:
- the gas pressure regulation system is configured to maintain a gas pressure of between 100 mTorr and 100 Torr in at least two of the ion source, the ion trap, and the ion detector;
- and
- the controller is configured to activate the ion detector to detect ions generated by the ion source according to a mass-to-charge ratio of the ions;
- and
- wherein the single mechanical pump operates at a frequency of less than 6000 cycles per minute to maintain the gas pressure.
9 more elements
A method, comprising:
- using a single mechanical pump operating at a frequency of less than 6000 cycles per minute to maintain a gas pressure in at least two of an ion source, an ion trap, and an ion detector of a mass spectrometer;
- and
- detecting ions generated by the ion source according to a mass-to-charge ratio of the ions,
- wherein the gas pressure in the at least two of the ion source, the ion trap, and the ion detector is maintained between 100 mTorr and 100 Torr.
1 more element
Dependencies are inferred from the claim text.