Wavefront imaging devices comprising a film with one or more structured two dimensional apertures and their applications in microscopy and photography
AssigneeCalifornia Institute of Technology
InventorsXiquan Cui, Changhuei Yang, Guillermo J. Tearney
Life of this patent
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Abstract
Embodiments of the present invention relate to a wavefront sensor comprising a film and a photodetector. The film has one or more structured two dimensional apertures configured to convert a phase gradient of a wavefront into a measurable form. The photodetector is configured to receive the wavefront through the one or more 2D apertures and measure the phase gradient of the wavefront.
Claims31
A wavefront sensor comprising:
- a single thickness film having one or more structured two dimensional (2D) apertures configured to convert a phase gradient of a wavefront into a measurable form;
- and
- a photodetector configured to:
- receive the wavefront through the one or more 2D apertures;
- and
- measure the phase gradient of the wavefront.
A method for detecting a wavefront, the method comprising:
- projecting a wavefront through a single thickness film having one or more structured two dimensional (2D) apertures onto a photodetector;
- receiving, by the photodetector, the wavefront projected through the one or more 2D apertures;
- and
- measuring a phase gradient of the received wavefront.
A wavefront imaging device comprising:
- a wavefront relay system configured to relay a wavefront generated by an illuminated object;
- a wavefront sensor comprising
- a single thickness film having one or more structured two dimensional (2D) apertures configured to convert a phase gradient of the wavefront into a measurable form, and
- a photodetector configured to
- receive the relayed wavefront, and
- measure the phase gradient of the received wavefront;
- and
- an output mechanism configured to output a phase gradient image.
A method for measuring a wavefront in an imaging device with a wavefront sensor comprising a photodetector and a single thickness film, the single thickness film having one or more structured two dimensional (2D) apertures configured to convert a phase gradient of the wavefront into a measurable form at the photodetector, the method comprising:
- illuminating an object;
- relaying the wavefront generated by the illuminated object;
- receiving the relayed wavefront at the wavefront sensor through the one or more structured 2D apertures in the single thickness film;
- and
- measuring, by the wavefront sensor, the phase gradient of the wavefront.
Dependencies are inferred from the claim text.