Opener and buffer table for test handler

An opener for a test handler comprising:

• an opening plate;
• a plurality of pin blocks that are formed in pairs, are movably coupled to the opening plate, and comprise opening pins fixed with the pin blocks for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board;
• and at least one or more interval retaining apparatuses for retaining an interval between the pin blocks forming a pair, and comprising an interval securing element for securing an interval between the pin blocks forming a pair, wherein the interval securing element is placed between the pin blocks and detachably coupled to the opening plate, wherein the interval between the plurality of the pin blocks that are formed in pairs varies based on movement of each of the plurality of the pin block, wherein each of the at least one or more interval retaining apparatuses comprises an interval retaining element for retaining the interval that is secured by the interval securing element, wherein the interval retaining element is integrally formed with the interval securing element, and wherein the interval retaining element comprises interval retaining protrusions that are integrally formed with the interval securing element, in which the interval retaining protrusions are inserted into protrusion receiving grooves that are formed in the pin blocks forming a pair.