In-line inspection methods and closed loop processes for the manufacture of prepregs and/or laminates comprising the same
AssigneeGeneral Electric Company
InventorsAndrzej Michael May, Waseem Ibrahim Faidi, Shu Ching Quek
Life of this patent
Estimating the term…
Abstract
In-line inspection methods are provided. The methods comprise measuring at least two parameters/properties of a prepreg and/or laminate during the manufacture thereof. In some embodiments, the data collected using the inline inspection methods may be processed and/or provided to a manual or automated controller, in order to provide a closed loop method for the manufacture of the prepregs and/or laminates. Apparatus for carrying out the methods are also provided, as are articles comprising a prepreg and/or laminate made using the apparatus.
Claims7
An apparatus for the manufacture of a prepreg and/or laminate comprising
- A resin infusion apparatus;
- A layup apparatus;
- An optical metrology unit for measuring at least one first property of the prepeg and/or the laminate, said at least one first property including surface topography;
- An ultrasound probe for measuring at least one second property of the prepeg and/or the laminate, said at least one second property including porosity;
- A controller for making adjustments in the operation of the resin infusion apparatus and/or the layup apparatus based on the at least one first property and the at least one second property;
- and
- A processor operatively disposed relative to the optical metrology unit and the ultrasound probe and the controller so that information may be transmitted therebetween.
A closed loop method for the manufacture of a prepreg and/or laminate comprising:
- conducting a step of a prepreg and/or laminate manufacturing process;
- measuring at least two properties of the prepreg and/or laminate, said at least two properties including surface topography and porosity;
- analyzing the measured at least two properties;
- and
- adjusting the manufacturing process according to the analysis of the measured at least two properties.
Dependencies are inferred from the claim text.