Low temperature plasma probe and methods of use thereof
AssigneePurdue Research Foundation
InventorsNicholas Charipar, Jason Harper, Zheng Ouyang, Robert Graham Cooks
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Abstract
The present invention generally relates to a low temperature plasma probe for desorbing and ionizing at least one analyte in a sample material and methods of use thereof. In one embodiment, the invention generally relates to a low temperature plasma probe including: a housing having a discharge gas inlet port, a probe tip, two electrodes, and a dielectric barrier, in which the two electrodes are separated by the dielectric barrier, in which application of voltage from a power supply generates a low temperature plasma, and in which the low temperature plasma is propelled out of the discharge region by the electric field and/or the discharge gas flow.
Claims10
A low temperature plasma probe comprising:
- a housing comprising a discharge gas inlet port, a probe tip, two electrodes, and a dielectric barrier, wherein the two electrodes are separated by the dielectric barrier, and wherein application of voltage to the two electrodes from a power supply generates an electric field and a low temperature plasma, wherein the electric field produced by the two electrodes propels the low temperature plasma out of the probe tip.
Dependencies are inferred from the claim text.