Test mode initialization device and method

Abstract

A die includes: a plurality of efuses, for respectively generating a plurality of test-mode signals; a control unit, coupled to a first control signal, for generating a plurality of control bits; a multiplexer, coupled to the plurality of test-mode signals and the control unit, for muxing the plurality of test-mode signals in series in response to the plurality of control bits; at least an address block, for receiving a specific test-mode signal; and at least a local test-mode block coupled to the address block. The local test-mode block comprises: a latch, for latching a specific test-mode signal and releasing the latched test-mode signal to the address block in response to a second control signal; a first decoder, for releasing the specific test-mode signal to the latch in response to the plurality of control bits; and a second decoder, for generating the second control signal to the latch.

Dependencies are inferred from the claim text.