Emmissivity test instrument for overhead electrical transmission and distribution
AssigneeElectric Power Research Institute, Inc.
InventorsDaniel Lawry, Bernard Francis Fitzgerald
Life of this patent
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Abstract
This invention relates to an emissivity test instrument for measuring the emissivity of overhead electric transmission conductors. The emissivity test instrument includes a vacuum chamber, a data acquisition module connected to the vacuum chamber and adapted to receive data therefrom, and a computing device. The vacuum chamber is adapted to seat a test sample therein. The computing device is connected to the data acquisition module and is adapted to perform a test on a test sample and generate a test results report.
Claims12
A method of determining the emissivity of overhead electric transmission conductors, comprising the steps of:
- (a) providing an emissivity test instrument;
- (b) preparing a test sample for testing by the emissivity test instrument, wherein the test sample is prepared by:
- (i) removing an inner core of the test sample;
- (ii) inserting a heater into the test sample;
- and
- (iii) banding the test sample to prevent the test sample from expanding;
- (c) running a test on the test sample;
- (d) collecting test data;
- and
- (e) using the test data to determine the emissivity of the test sample using
- q
- r
- =
- 0.138
-
-
- D
-
-
- ɛ
- ·
- [
- (
- T
- c
- +
- 273
- 100
- )
- 4
- -
- (
- T
- a
- +
- 273
- 100
- )
- 4
- ]
- .
- where qr is the radiated heat loss, D is the diameter of the test sample in inches, ε is the emissivity of the test sample, Tc is the temperature of the test sample in degrees Celsius, and Ta is the ambient temperature in degrees Celsius.
A method of determining the emissivity of overhead electric transmission conductors, comprising the steps of:
- (a) providing an emissivity test instrument having:
- (i) a vacuum chamber;
- (ii) a data acquisition module;
- and
- (iii) a computing device;
- (b) preparing a test sample for testing by the emissivity test instrument;
- (c) hanging the test sample in the vacuum chamber and sealing the test sample therein;
- (d) heating the test sample to a first stage of heat where the test sample reaches a temperature Trating−Tanticipation, where Tratinq is equal to a temperature rating of the test sample and Tanticipation is equal to a pre-determined temperature constant of the test sample;
- (e) initiating the computing device and running a test on the test sample;
- and
- (f) determining the emissivity of the test sample.
Dependencies are inferred from the claim text.