Interferometric systems having reflective chambers and related methods

An interferometric system comprising:

• a light source configured to generate an illumination beam that propagates towards a sample;
• a sample holder defining an interior for holding the sample and including a partially reflective cover for allowing a first portion of the illumination beam to pass therethrough to interact with the sample to produce a sample beam that propagates substantially along an optical axis, wherein the partially reflective cover is oriented at an angle with respect to the optical axis for reflecting a second portion of the illumination beam to produce a reference beam that propagates at a predetermined angle with respect to the optical axis;
• an imaging module positioned to receive the sample and reference beams and configured to redirect the reference beam towards the optical axis at a detection plane;
• and
• a detector positioned to intercept the sample and reference beams along the optical axis and the detection plane, and configured to generate a holographic representation of the sample based on the sample and reference beams.